LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions
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2017 | 2017 | ||
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*: <u> | *; Complementary electron microscopic-spectroscopic characterization of Ti and Cr adhesion layers | ||
*: <u>M. Todeschini</u>, A. B. da Silva Fanta, J. B. Wagner, F. Jensen, A. Han<br> Abstract and Poster at ''43rd International conference on Micro and Nano Engineering'', Braga, Portugal, 2017. | |||
*; Electron Microscopy Characterization of Adhesion Layer Influence on Ultra-thin Gold Films | |||
*: <u>M. Todeschini</u>, A. B. da Silva Fanta, F. Jensen, A. Han, J. B. Wagner<br> Oral presentaion at ''68th Annual Conference of the Nordic Microscopy Society (SCANDEM 2017)'', Reykjavík, Iceland, 2017. | |||
2016 | 2016 | ||
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*; Adhesion layer investigation with complementary characterization methods for energy loss reduction in electronic nanodevices | *; Adhesion layer investigation with complementary characterization methods for energy loss reduction in electronic nanodevices | ||
*: <u>M. Todeschini</u>, A. B. da Silva Fanta, A. Burrows, J. B. Wagner, F. Jensen, A. Han<br> | *: <u>M. Todeschini</u>, A. B. da Silva Fanta, A. Burrows, J. B. Wagner, F. Jensen, A. Han<br> Oral presentation at ''Sustain-ATV Conference 2016'', Kgs. Lyngby, Denmark, 2016. | ||