Specific Process Knowledge/Thin film deposition/Deposition of Titanium Nitride: Difference between revisions
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== Deposition of Titanium Nitride == | == Deposition of Titanium Nitride == | ||
Thin films of Titanium Nitride (TiN) can be deposited by either [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD]] or reactive sputtering. If sputtering is used, the target is Ti and nitrogen (N<sub>2</sub>) is added as reactive gas to the chamber resulting the formation of Titanium Nitride on the sample. The process information is available below: | Thin films of Titanium Nitride (TiN) can be deposited by either [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD]] or reactive sputtering. If sputtering is used, the target is titanium (Ti), and nitrogen (N<sub>2</sub>) is added as a reactive gas to the chamber, resulting in the formation of Titanium Nitride on the sample. The process information is available below: | ||
*[[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)/TiN deposition using ALD2|TiN deposition using ALD]]. | *[[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)/TiN deposition using ALD2|TiN deposition using ALD]]. | ||
Revision as of 15:46, 28 July 2025
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Deposition of Titanium Nitride
Thin films of Titanium Nitride (TiN) can be deposited by either ALD or reactive sputtering. If sputtering is used, the target is titanium (Ti), and nitrogen (N2) is added as a reactive gas to the chamber, resulting in the formation of Titanium Nitride on the sample. The process information is available below:
- TiN deposition with reactive sputtering using Sputter-System Metal-Nitride (PC3) - preferable option.
Comparison between sputtering and ALD methods for deposition of Titanium Nitride.
| ALD2 | Sputter-System Metal-Oxide (PC1)/Sputter-System Metal-Nitride (PC3) | Sputter-System(Lesker) | |
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| Stoichiometry |
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| Film Thickness |
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| Deposition rate |
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| Step coverage |
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| Process Temperature |
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| Substrate size |
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| Allowed materials |
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