Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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* Hardware: In order to work the SEM needs a chamber under vacuum and sophisticated electronics. | * Hardware: In order to work the SEM needs a chamber under vacuum and sophisticated electronics. | ||
* Sample preparation and mounting: You may have to prep your sample in several ways, either coating, cleaving or mounting on specific sample holders. | * Sample preparation and mounting: You may have to prep your sample in several ways, either coating, cleaving or mounting on specific sample holders. | ||
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== Atomic Force Microscope (AFM)== | == Atomic Force Microscope (AFM)== | ||