Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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* Sample preparation and mounting: You may have to prep your sample in several ways, either coating, cleaving or mounting on specific sample holders. | * Sample preparation and mounting: You may have to prep your sample in several ways, either coating, cleaving or mounting on specific sample holders. | ||
== | == Atomic Force Microscope (AFM)== | ||
The [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope]] has limited use as a sample imaging instrument. In some cases the resolution of the SEM is not enough: | The [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope]] has limited use as a sample imaging instrument. In some cases the resolution of the SEM is not enough: | ||