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Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

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Mmat (talk | contribs)
NLAB-Employees-701, NLAB-LabmanagerAllUsers, Administrators
1,954 edits
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'''Imaging Equipment:'''
*[[Specific_Process_Knowledge/Characterization/Optical_microscope|Optical Microscopes]]


*[[Specific_Process_Knowledge/Characterization/Optical_microscope|Sample imaging using optical microscopes]]
*[[Specific_Process_Knowledge/Characterization/Sensofar S Neox|Optical Profiler (e.g. ''Sensofar S Neox'')]]


*[[Specific_Process_Knowledge/Characterization/Sensofar S Neox|Sample imaging using optical profiler (Sensofar S Neox)]]
*[[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy|Scanning Electron Microscopy (SEM)]]


*[[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy|Sample imaging using SEM]]
*[[Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy|Atomic Force Microscopy (AFM)]]


*[[Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy|Sample imaging using AFM (NanoMan)]]
*[[Specific_Process_Knowledge/Characterization/Dektak XTA|Stylus Profiler (e.g ''Dektak XTA'')]]
 
*[[Specific_Process_Knowledge/Characterization/Dektak XTA|Sample imaging using stylus profiler (Dektak XTA)]]


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==Comparison of optical microscope, optical profiler, SEM, AFM and stylus profiler for sample imaging==
==Comparison of optical microscope, optical profiler, SEM, AFM and stylus profiler for sample imaging==


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