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Specific Process Knowledge/Characterization/X-Ray Diffractometer: Difference between revisions

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'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''
'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''


''Text and photo DTU Nanolab internal''
''Text and photo by staff at DTU Nanolab or DTU Electro (previously DTU Photonics Engineering)''


==X-Ray Diffractometer '''DECOMMISSIONED, NO LONGER IN LAB''' ==
==X-Ray Diffractometer <span style="color:Red">This machine has been decommissioned - see other XRD setups at DTU Nanolab [[Specific Process Knowledge/Characterization/XRD| HERE]] </span>==


[[file:X-ray_diffractometer.jpg|300px|right|thumb|X-ray diffractometer]]
[[file:X-ray_diffractometer.jpg|300px|right|thumb|X-ray diffractometer]]
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''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''
''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''
Nanolab also has a X-Ray Diffractometer for public acess. You can see it by clicking [[Specific Process Knowledge/Characterization/XRD| HERE]]


X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.
X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.