Jump to content

Specific Process Knowledge/Characterization/XPS/NexsaOverview: Difference between revisions

← Older editNewer edit →
VisualWikitext
Jmli (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,565 edits
No edit summary
Jmli (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,565 edits
No edit summary
Line 9: Line 9:
*'''Abstract''': Hover the mouse over the text to show the abstract of the article.
*'''Abstract''': Hover the mouse over the text to show the abstract of the article.
[[Template:Nexsa-addpubrow]]
[[Template:Nexsa-addpubrow]]
{{Template:Nexsa-addpubrow
|LMdocID=
|LMdocTitle=
|LMdocType=
|LMdocAuthor=
|docLink=
|XPSused=    |UPSused=  |ISSused=    |REELSused=    |Ramanused=
|AdditionalOption=
|Sample=
|Abstract=
}}
{{Template:Nexsa-addpubrow
|LMdocID=5385
|LMdocTitle=Multitechnique Surface Characterization of Organic LED Material
|LMdocType=Application note
|LMdocAuthor=P Mack
|docLink=https://assets.thermofisher.com/TFS-Assets/MSD/Application-Notes/AN52109_E_Organic_LED_0411M_H_1.pdf
|XPSused=x    |UPSused=x  |ISSused=    |REELSused=x    |Ramanused=
|AdditionalOption=
|Sample=Organic LED's
|Abstract=Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron spectroscopy (UPS). XPS was used to analyze the surface composition of the material and by combining the information from REELS and UPS a full energy level diagram of the material was created using a single instrument.
}}


{{Template:Nexsa-tableheader}}
{{Template:Nexsa-addpubrow
|LMdocID=5384
|LMdocTitle=Advantages of coincident XPS-Raman in the analysis of mineral oxides species
|LMdocType=Application note
|LMdocAuthor= Thermofisher Scientific
|docLink=https://assets.thermofisher.com/TFS-Assets/MSD/Application-Notes/advantages-coincident-xps-raman-mineral-oxides-species-AN52994.pdf
|XPSused=x    |UPSused=  |ISSused=    |REELSused=    |Ramanused=x
|AdditionalOption=
|Sample=TiO<sub>2</sub>, CaCO<sub>3</sub>
|Abstract=
}}
 
{{Template:Nexsa-addpubrow
|LMdocID=5386
|LMdocTitle=Spectroscopic analysis of solid oxide fuel cell material with XPS
|LMdocType=Application note
|LMdocAuthor=P Mack
|docLink=https://assets.thermofisher.com/TFS-Assets/MSD/Application-Notes/AN52110-spectroscopic-analysis-solid-oxide-fuel-cell-material-xps.pdf
|XPSused=x    |UPSused=  |ISSused=    |REELSused=    |Ramanused=
|AdditionalOption=
|Sample=
|Abstract=
}}
 
{{Template:Nexsa-addpubrow
|LMdocID=
|LMdocTitle=Rapid XPS image acquisition using SnapMap
|LMdocType=Application note
|LMdocAuthor=R Simpson
|docLink=https://assets.thermofisher.com/TFS-Assets/MSD/Application-Notes/AN52330-rapid-xps-image-acquisition-using-snapmap.pdf
|XPSused=    |UPSused=  |ISSused=    |REELSused=    |Ramanused=
|AdditionalOption=SnapMap
|Sample=
|Abstract=
}}


| [[media:AN52109_E_Organic_LED_0411M_H_1.pdf | Multitechnique Surface Characterization of Organic LED Material]]||Application note||P Mack ||||X||X||||X||||||Organic LED's||<span title="Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron spectroscopy (UPS). XPS was used to analyze the surface composition of the material and by combining the information from REELS and UPS a full energy level diagram of the material was created using a single instrument."> Abstract</span>
|-
| [[media:advantages-coincident-xps-raman-mineral-oxides-species-AN52994.pdf | Advantages of coincident XPS-Raman in the analysis of mineral oxides species]]||Application note||||||X||||||||X||||TiO2, CaCO3||
|-
| [[media:AN52110-spectroscopic-analysis-solid-oxide-fuel-cell-material-xps.pdf | Spectroscopic analysis of solid oxide fuel cell material with XPS]]||Application note||P Mack ||||X||||||||||||||
|-
| [[media:AN52330-rapid-xps-image-acquisition-using-snapmap.pdf | Rapid XPS image acquisition using SnapMap]]||Application note||R Simpson||||X||||||||||SnapMap||||
|-
|-
| [[media:AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf | Composition, coverage and band gap analysis of ALD-grown ultra thin films]]||Application note||P Mack ||||X||||X||X||||Band gap||Gate dielectrics, HfO2, SiO2||
| [[media:AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf | Composition, coverage and band gap analysis of ALD-grown ultra thin films]]||Application note||P Mack ||||X||||X||X||||Band gap||Gate dielectrics, HfO2, SiO2||
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/XPS/NexsaOverview"