Specific Process Knowledge/Characterization/XPS/Nexsa: Difference between revisions
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'''Check out the alternative techniques!''' | '''Check out the alternative techniques!''' | ||
It is clearly in everybody's interest that the techniques are explored - that we throw all kinds of samples at them and that we investigate what kind of knowledge we can extract. Ideally, all this knowledge that we | It is clearly in everybody's interest that the techniques are explored - that we throw all kinds of samples at them and that we investigate what kind of knowledge we can extract. Ideally, all this knowledge that we acquire should be shared among all the users. We therefore strongly urge you to take a look at the techniques on the pages listed below. Here, we will collect technical information and publications so that, hopefully, you will get inspired to explore the techniques with all kinds of samples. | ||
*[https://xpssimplified.com/whatisxps.php XPSsimplified - The Thermofisher web page on all the Nexsa techniques] | *[https://xpssimplified.com/whatisxps.php XPSsimplified - The Thermofisher web page on all the Nexsa techniques] | ||
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*[[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]] | *[[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]] | ||
*[[Specific Process Knowledge/Characterization/XPS/UPS technique|Ultraviolet Photoelectron Spectroscopy or UPS]] | *[[Specific Process Knowledge/Characterization/XPS/UPS technique|Ultraviolet Photoelectron Spectroscopy or UPS]] | ||
'''Specific measurements''' | |||
The Nexsa is capable of measuring a lot of | |||
; Work function measurements | |||
: Based on the measurements of the Fermi Level and the spectrum energy cut-off in a UPS spectrum, the work function may be measured. The Nexsa manual section 3.6.x has more information. | |||
; Band gap measurements | |||
: | |||
; Mapping electronic bands using Angle resolved XPS (ARXPS) and UPS (ARUPS) | |||
: The Nexsa is capable of measuring the following | |||
*[[Specific Process Knowledge/Characterization/XPS/NexsaOverview|Table with a set of publications in which multiple techniques are used]] | *[[Specific Process Knowledge/Characterization/XPS/NexsaOverview|Table with a set of publications in which multiple techniques are used]] | ||