Specific Process Knowledge/Characterization/Optical characterization/advanced ellipsometry: Difference between revisions
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Created page with "== Examples of advanced use of the ellipsometer== ===Dielectric function measurement of emerging semiconductors by Andrea Crovetto=== [[Media:2016_11_ancro_ellipsometry_at_Dan..." |
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== Examples of advanced use of the ellipsometer== | == Examples of advanced use of the ellipsometer== | ||
===Dielectric function measurement of emerging semiconductors by Andrea Crovetto=== | ===Dielectric function measurement of emerging semiconductors by Andrea Crovetto@Nanotech 2016=== | ||
[[Media:2016_11_ancro_ellipsometry_at_Danchip.pdf]] <br> | [[Media:2016_11_ancro_ellipsometry_at_Danchip.pdf]] <br> | ||
Content: | Content: | ||