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Specific Process Knowledge/Thin film deposition/Deposition of Chromium

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Studies of Cr deposition processes

Roughness of Chromium - Roughness and Uniformity of Cr layers deposited with different methods and settings

Sputtering of Cr in Sputter system (Lesker) - Settings and deposition rates

Sputtering of Cr in Sputter-system Metal-Oxide (PC1) - Settings and deposition rates

Sputtering of Cr in Sputter-system Metal-Nitride (PC3) - Settings and deposition rates

Thermal evaporation of Cr in Thermal evaporator - Settings and deposition results

Stress in sputtered Cr films - Extremely high tensile stress in Cr films deposited at high temperature

Chromium deposition

Chromium can be deposited by e-beam evaporation, thermal evaporation, and sputter deposition. It should be noted that in e-beam evaporation, chromium does not melt but evaporates directly from the solid phase. In the chart below you can compare the different deposition equipment.

E-beam evaporation (E-beam evaporator (Temescal) and E-beam evaporator (10-pockets)) Thermal evaporation (Thermal evaporator) Sputter deposition (Lesker sputterer) Sputter deposition ((Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)) )
General description E-beam deposition of Chromium Thermal deposition of Chromium Sputter deposition of Chromium Sputter deposition of Chromium
Pre-clean Ar ion gun (only in E-beam evaporator Temescal) RF Ar clean
Layer thickness 10Å to 300 nm* 100 nm at least up to 200 nm at least up to 200 nm
Deposition rate 1 Å/s to 10 Å/s 1 Å/s Depends on process parameters. At least up to 1.48 Å/s. See process log. Depends on process parameters.
Batch size
  • 4x6" wafers or
  • 3x8" wafers (ask for holder)
  • Many smaller pieces
  • Up to *3x 4" wafers or
  • 1x6" or 1x 8" wafer
  • Many smaller samples
  • 1x6" wafers
  • Smaller pieces/wafers
  • up to 10x4" wafers or
  • up to 10x6" wafers or
  • many smaller samples
Allowed materials

Almost any that does not degas. See the cross-contamination sheet.

Almost any that does not degas. See the cross-contamination sheet.

  • Silicon wafers
  • and almost any
  • Almost that does not degas - see cross contamination sheets for PC1 and PC3
  • Special carrier for III-V materials.
Comment Takes approx. 20 min to pump down Takes approx. 20 min to pump down Takes approx. 5 min to pump down load lock and 6 min for transfer to processing chamber

* For thicknesses above 300 nm, please request permission from metal@nanolab.dtu.dk to ensure there is enough material and to prioritize chamber cleaning as Cr tends to be a high-stress layer and thus causes flaking,