The tests were done on 2" quartz wafers with a thickness of 1mm. These were placed on a 65mmx65mmx6,25mm quartz plate with a 2" groove. This 65mmx65mmx6,25mm plate was placed on a 4" Si wafer with a 65mmx65mm groove. the masking material was Cr sputter deposited in Wordentec and and patterned with ZEP520A resist by e-beam and ICP metal Cr etch.
Recipe used STS65x65:
Parameter
Crom mask
Coil Power [W]
1200
Platen Power [W]
500
Platen temperature [oC]
50
CFFailed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle _4}
flow [sccm]
43
CFailed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle _4}
FFailed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle _8}
flow [sccm]
20
OFailed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle _2}
flow [sccm]
10
Pressure [mTorr]
8
Parameter
Results
Etch rate
~300nm/min
Etch profile
86-87 degrees
ARDE
There does not seem to be a significant aspect ratio dependency in the etch rate up to aspect ratio 1:2 ~ 1:3
Mask selectivity
20nm Cr is enough to etch 200nm in the quartz
Images
.
I am currently working on getting the right images in: 6. Jan 2012 /BGE