Specific Process Knowledge/Lithography/Development/Developer TMAH UV-lithography processing: Difference between revisions
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Information about exposure dose can be found here: [[Specific_Process_Knowledge/Lithography/Resist#UV_Resist|Information on UV exposure dose]] | Information about exposure dose can be found here: [[Specific_Process_Knowledge/Lithography/Resist#UV_Resist|Information on UV exposure dose]] | ||
'''2µm AZ nLOF 2020''' | |||
PEB: 60s @ 110°C | PEB: 60s @ 110°C | ||
Development: SP 30s. For lift-off, use SP 60s (sidewall angle ~15°) | Development: SP 30s. For lift-off, use SP 60s (sidewall angle ~15°) | ||
'''1.5µm AZ MiR 701''' | |||
PEB: 60s @ 110°C | PEB: 60s @ 110°C | ||
Development: SP 60s | Development: SP 60s | ||
'''1.5µm AZ 5214E''' (positive process) | |||
No PEB | No PEB | ||
Development: SP 60s | Development: SP 60s | ||
'''2.2µm AZ 5214E''' (image reversal) | |||
Reversal bake: 120s @ 110°C | Reversal bake: 120s @ 110°C | ||
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Development: SP 60s | Development: SP 60s | ||
'''6.2µm AZ 4562''' | |||
No PEB | No PEB | ||
Development: MP 3x60s | Development: MP 3x60s | ||
'''10µm AZ 4562''' | |||
No PEB | No PEB | ||