Specific Process Knowledge/Thin film deposition/Deposition of Titanium Oxide: Difference between revisions
→Comparison of the methods for deposition of Titanium Oxide: added sputter-system metal-oxide pc1 |
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*TiO<sub>2</sub> created from a Ti sputter target. By adding oxygen during the deposition TiO2 is created. | *TiO<sub>2</sub> created from a Ti sputter target. By adding oxygen during the deposition TiO2 is created. | ||
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*Reactive DC sputtering of Ti target | *Reactive DC sputtering of Ti target | ||
* | *Reactive or non-reactive RF sputtering of TiO2 target | ||
*Reactive pulsed DC sputtering | *Reactive pulsed DC sputtering | ||
*Reactive HIPIMS (high-power impulse magnetron sputtering | *Reactive HIPIMS (high-power impulse magnetron sputtering) | ||
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*Reactive DC sputtering of Ti target in Ar/O2 (10% O2) plasma | *Reactive DC sputtering of Ti target in Ar/O2 (10% O2) plasma |
Revision as of 11:58, 23 April 2020
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Deposition of Titanium Oxide
Titanium oxide can be deposited either by a sputter technique or by use of ALD (atomic layer deposition). In sputter deposition of titanium oxide, the target is Ti and oxygen is added to the chamber during the process resulting in Titanium oxide on the sample. Therefore some process development may be necessary to achieve the correct stoichiometry.
Comparison of the methods for deposition of Titanium Oxide
Sputter technique using IBE/IBSD Ionfab300 | Sputter-system Metal-Oxide(PC1) | Sputter-System(Lesker) | ALD Picosun 200 | |
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Generel description |
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Stoichiometry |
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Film Thickness |
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Deposition rate |
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Step coverage |
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Process Temperature |
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More info on TiO2 |
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ALD1: ALD2: | |
Substrate size |
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ALD1:
ALD2:
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Allowed materials |
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