Specific Process Knowledge/Thin film deposition/Deposition of Titanium Oxide: Difference between revisions
Appearance
| Line 109: | Line 109: | ||
* | * | ||
| | | | ||
*[[Specific Process Knowledge/Thin film deposition/ALD Picosun R200/TiO2 deposition using ALD|TiO2 deposition using | ALD1: | ||
*[[Specific Process Knowledge/Thin film deposition/ | *[[Specific Process Knowledge/Thin film deposition/ALD Picosun R200/TiO2 deposition using ALD|TiO2 deposition using ALD1]] | ||
ALD2: | |||
*[[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)/TiO2 deposition using ALD2|TiO2 deposition using ALD2]] | |||
|- | |- | ||
| Line 155: | Line 157: | ||
| | | | ||
| | | | ||
*Silicon | *Silicon | ||
*Silicon oxide, silicon nitride | *Silicon oxide, silicon nitride | ||
*Quartz/fused silica | *Quartz/fused silica | ||
* | *Metals - Use a dedicated carrier wafer | ||
*III-V materials - Use dedicated carrier wafer | |||
*Polymers - Depending on the melting point/deposition temperature, use dedicated carrier wafer. Ask for permission | |||
*III-V materials | |||
*Polymers | |||
|- | |- | ||
|} | |} | ||