Specific Process Knowledge/Lithography/UVExposure: Difference between revisions

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The MLA 100 Maskless Aligner located in the E-5 cleanroom is direct write lithography tool.  
The MLA 100 Maskless Aligner located in the E-5 cleanroom is a direct write lithography tool.  
It is UV LED exposure system, that exposes the patterns directly on photosensitive resists on chips, 2, 4, and 6 inch substrates, without prior fabrication of the mask.  
It is UV LED exposure system, that exposes the patterns directly on photosensitive resists on chips, 2, 4, and 6 inch substrates, without prior fabrication of the mask.  
The system offers an alignment option with high accuracy.
The system offers an alignment option with high accuracy.

Revision as of 11:22, 1 November 2017

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UV Exposure Comparison Table

Equipment KS Aligner Aligner: MA6 - 2 Aligner: 6inch Aligner: Maskless 01 Inclined UV Lamp
Purpose
  • Top Side Alignment
  • Back Side Alignment
  • UV exposure
  • Top Side Alignment
  • Back Side Alignment
  • UV exposure
  • (DUV exposure)
  • Bond alignment
  • Top Side Alignment
  • Back Side Alignment
  • UV exposure
  • Top Side Alignment
  • Direct UV writing
  • UV exposure
  • DUV exposure
Performance Minimum feature size
  • 1.25µm down to 1.0µm
  • 1.25µm down to 0.5µm
  • 1.25µm
  • 3µm
Exposure light/filters/spectrum
  • 350W Hg lamp
  • i-line filter (365nm notch filter), intensity in Constant Intensity mode: 7mW/cm2 @ 365nm
  • 303nm filter optional
  • 500W Hg-Xe lamp
  • i-line filter (365nm notch filter), intensity in Constant Intensity mode: ~13mW/cm2 @ 365nm
  • UV350 optics optional
  • UV250 optics optional
  • 350W Hg lamp
  • SU8 filter (long-pass), intensity in Constant Power mode: 7mW/cm2 @ 365nm
  • i-line filter optional
  • 365nm LED
  • 1000 W Hg-Xe lamp
  • near UV (350-450nm), mid UV (260-320nm), and deep UV (220-260nm)
Exposure mode
  • proximity, soft, hard, vacuum contact
  • proximity, soft, hard, vacuum contact
  • proximity, soft, hard, vacuum contact
  • Direct writing
  • Flood exposure
  • Proximity exposure with home-made chuck and maskholder
Substrates Batch size
  • 1 small sample
  • 1 50 mm wafer
  • 1 100 mm wafer
  • 1 150 mm wafer
  • 1 small sample
  • 1 50 mm wafer
  • 1 100 mm wafer
  • 1 150 mm wafer
  • 1 50 mm wafers
  • 1 100 mm wafers
  • 1-25 150 mm wafers with automatic handling
  • 1 small sample, down to 5x5 mm2
  • 1 50 mm wafer
  • 1 100 mm wafer
  • 1 150 mm wafer
  • all sizes up to 8inch
Allowed materials
  • All cleanroom materials except copper and steel
  • Dedicated 2inch chuck for III-V materials
  • All cleanroom materials except copper and steel
  • Dedicated chuck for III-V materials
  • All cleanroom materials except III-V materials, copper and steel substrates, and type IV films
  • Silicon
  • Glass
  • All cleanroom materials


KS Aligner

The KS Aligner is placed in E-4

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SUSS Mask Aligner MA6 is designed for high resolution photolithography. The 365nm exposure wavelength version is capable of 1.25 (1.0) um resolution in vacuum contact. All contact exposure programs (vacuum, hard, soft, proximity) are supplied. Two alignment options are available: top side alignment (TSA) with a split field or a video microscope and back side alignment (BSA) with BSA microscope. It is also possible to make IR- light alignment.

Training videos: Operation Alignment (on Aligner: MA6-2, but KS Aligner is the same model)

The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager.

Process information

The KS Aligner has an i-line notch filter installed. This results in an exposure light peak around 365nm with a FWHM of 7nm. Dependent on the spectral sensitivity of the resist, the optimal dose may be increased compared to broadband exposure on the Aligner-6inch.

Equipment performance and process related parameters

Purpose

Alignment and UV exposure

Performance Exposure mode

vacuum contact, hard contact, soft contact, proximity, flood exposure

Exposure light/filters
  • broadband (i-, g-, h-line)
  • 365 nm (i-line)
  • 303 nm
Minimum structure size

down to 1.25µm

Mask size
  • 5x5 inch
  • 7x7 inch
  • special holder for 4 x 2" designs on 5x5 inch
Alignment modes
  • Top side (TSA)
  • Backside (BSA)
Substrates Substrate size
  • small pieces 1x1cm
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
Allowed materials

All cleanroom materials except copper and steel

Dedicated chuck for III-V materials

Batch

1


Aligner: MA6 - 2

The Aligner: MA6 - 2 is placed in E-4

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The Süss MicroTek Mask Aligner MA6 is designed for high resolution photolithography. The 365nm exposure wavelength version is capable of 1.25 (1.0) um resolution in vacuum contact. All contact exposure programs (vacuum, low vacuum, hard, soft, proximity) are supplied. Two alignment options are available: top side alignment (TSA) with a split field or a video microscope and back side alignment (BSA) with BSA (video) microscope.

The aligner can also be used for bond alignment (for Wafer Bonder 02). Special training is required.

Training videos: Operation Alignment

The user manual, APV, and contact information can be found in LabManager.

Process information

The Aligner: MA6 - 2 has an i-line notch filter installed. This results in an exposure light peak at 365nm. Compared to exposure on the KS Aligner, the optimal dose should be very similar. Dependent on the spectral sensitivity of the resist, the optimal dose may be increased compared to broadband exposure on the Aligner-6inch.

The 500W Hg-Xe lamp also enables exposure in the DUV range around 240nm. This functionality is not established yet, partly due to safety concerns.

Equipment performance and process related parameters

Purpose

Mask alignment and UV exposure, potentially DUV exposure 1)

Bond alignment

Performance Exposure mode

vacuum contact, hard contact, soft contact, proximity, flood exposure

Exposure light/filters
  • broadband (i-, g-, h-line)
  • 365 nm (i-line)
  • "UV300" (280-350 nm)
  • DUV (240 nm) 1)
Minimum structure size

Typically 1.25 µm, possibly down to 0.8 µm 1)

Mask size
  • 5x5 inch
  • 7x7 inch
  • special holder for 4 x 2" designs on 5x5 inch
Alignment modes
  • Top side (TSA)
  • Backside (BSA)
Substrates Substrate size
  • small pieces 1x1cm
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
Allowed materials

All cleanroom materials except copper and steel

Dedicated chuck for III-V materials

Batch

1

1) Not available yet.


Aligner-6inch

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Aligner-6inch EVG620 is placed in E-5

Aligner-6inch, EVG620 aligner, is designed for high resolution photolithography. The machine can be used for 2, 4 and 6 inch substrates. Cassette-to-cassette handling option is available only for 6inch substrates. The automatic pattern recognition software is available for the special alignment marks design recommended of EVGroup. Please contact Danchip staff for further information. Available exposure mode: proximity, soft, hard and vacuum contact. Two alignment options are available: top side alignment (TSA) and back side alignment (BSA). IR-light alignment also an option.

The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager

Process information

The Aligner-6inch has a long pass filter designed for SU-8 exposure installed. The SU-8 filter has no transmission in the 250-330nm range, and close to full transmission in the 400-500nm range. In the 350-370nm range, the transmission is approximately 0.5. This results in a broadband exposure light consisting of the i-line (365nm), the h-line (405nm), and the g-line (435nm) from the Hg spectrum. Dependent on the spectral sensitivity of the resist, the optimal dose may be decreased compared to i-line exposure on the KS-Aligner.

Equipment performance and process related parameters

Purpose

Alignment and UV exposure, potentially DUV exposure

Performance Exposure mode

vacuum contact, hard contact, soft contact, proximity, flood exposure

Exposure light/filters
  • broadband (i-, g-, h-line)
  • SU8 filter (½i-, g-, h-line)
  • 365 nm (i-line)
Minimum structure size

down to 1.25µm

Mask size
  • 5x5 inch
  • 7x7 inch
Alignment modes
  • Top side (TSA)
  • Backside (BSA)
Substrates Substrate size
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
Allowed materials

All substrates except III-V, copper, and steel

All films except type IV

Batch

1


Aligner: Maskless 01

This section is under construction

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The MLA 100 Maskless Aligner located in the E-5 cleanroom is a direct write lithography tool. It is UV LED exposure system, that exposes the patterns directly on photosensitive resists on chips, 2, 4, and 6 inch substrates, without prior fabrication of the mask. The system offers an alignment option with high accuracy.

Aligner: Maskless 01 positioned in E-5

The user manual and contact information can be found in LabManager: Equipment info in LabManager

Equipment performance and process related parameters

Purpose

Alignment and UV exposure

Performance Exposure mode

Direct writing

Exposure light/filters

365nm (LED), FWHM=8nm

Minimum structure size

down to 3µm

Design formats
  • GDS-II
  • DXF
  • CIF
  • Gerber
  • HIMT format
Alignment modes

Top side only

Substrates Substrate size
  • 150 mm wafer
  • 100 mm wafer
  • 50 mm wafer
  • pieces down to 5x5 mm2
Allowed materials

Silicon and glass

Batch

1


Inclined UV Lamp

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Inclined UV lamp is placed in E-5

The Inclined UV lamp is 1000 W Hg(Xe)lamp source designed for near UV, 350-450nm, mid UV, 260-320nm, and deep UV, 220-260nm exposures of resists and polymers. The exposure source can be also used to make an inclined exposure in air or in the media tank.

The tool was purchased in February 2009 from Newport. The exposure lamp has a official name: Oriel Flood Exposure Source, unit 92540. All other parts of equipment: substrate and mask holder with media tank, exhaust box around the tool, timer controller, were designed and build at DTU Danchip workshop.

The substrate and mask holder with a media tank was designed as part of Master Thesis of DTU Nanotech, Andres Kristensen group. The exhaust box was made as part of safety and the timer controller was build to control exposure time.

The technical specification and the general outline of the equipment can be found in LabManager.

The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager.


Equipment performance and process related parameters

Purpose

UV exposure

Performance Exposure mode
  • Flood exposure
  • Proximity exposure with mask possible for 4inch substrate
Exposure light/filters
  • Near UV(350-450nm)
  • Mid UV (260-320nm)
  • Deep UV(220-260nm)
Minimum structure size
Mask size

5x5inch optinal

Alignment modes

No alignment possible

Substrates Substrate size

Up to 8inch substrates, different shapes

Allowed materials

All cleanroom materials

Batch

1