Specific Process Knowledge/Characterization: Difference between revisions
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|align="left"| [[Specific_Process_Knowledge/Characterization/Stress_measurement|Film stress]]||||||||x||||||||||||||||||x|||||||||||| | |align="left"| [[Specific_Process_Knowledge/Characterization/Stress_measurement|Film stress]]||||||||x||||||||||||||||||x 7)|||||||||||| | ||
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# Only single layer | # Only single layer | ||
# Good for characterization of VCSEL structures and DBR mirrors | # Good for characterization of VCSEL structures and DBR mirrors | ||
# Only for crystalline films | |||
== Choose characterization topic == | == Choose characterization topic == | ||