Specific Process Knowledge/Thin film deposition/Deposition of Aluminium: Difference between revisions
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*[[/Al sputtering in Sputter System (Lesker) |Al sputtering in Sputter System (Lesker)]] | *[[/Al sputtering in Sputter System (Lesker) |Al sputtering in Sputter System (Lesker)]] | ||
*[[/Al_Sputtering_in_Cluster_Lesker_PC3 |Al Sputtering in Sputter-System Metal-Nitride(PC3)]] | |||
==E-beam evaporation of Aluminium== | ==E-beam evaporation of Aluminium== |
Revision as of 14:30, 23 December 2022
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Deposition of Aluminium
Aluminium can be deposited by e-beam evaporation, by sputtering and by thermal evaporation. In the chart below you can compare the different methods on the different deposition equipment.
Sputtering of Aluminium
Aluminium may be sputter deposited in either the Wordentec, the sputter-system (Lesker), or the cluster-based sputter system ("Sputter-System Metal-Oxide(PC1)" and "Sputter-System Metal-Nitride(PC3)"). See more in the matrix below.
E-beam evaporation of Aluminium
Aluminium can be deposited by e-beam assisted evaporation in the Wordentec, Physimeca and Temescal tools.
Thermal deposition of Aluminium
In the Wordentec and the Thermal evaporator aluminium can be deposited by thermal deposition. The two instruments are compared on the following page:
Comparison of Al deposition options
E-beam evaporation (Temescal) | E-beam evaporation (Wordentec) | Sputter deposition (Wordentec) | Sputter deposition (Sputter-System (Lesker)) | Sputter deposition (Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)) | Thermal evaporation (Wordentec) | Thermal evaporation (Thermal Evaporator) | |
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General description |
E-beam deposition of Aluminium |
E-beam deposition of Aluminium |
Sputter deposition of Aluminium |
Sputter deposition of Aluminium |
Sputter deposition of Aluminium |
Aluminum deposition onto unexposed e-beam resist |
Aluminum deposition onto unexposed e-beam resist |
Pre-clean | Ar ion etch | RF Ar clean | RF Ar clean | ||||
Layer thickness | 10Å to 1 µm* | 10Å to 1 µm* | 10Å to ~0.5µm | 10Å to ~0.5µm (very time consuming ) | 10Å to ~0.5µm | 10Å to 0.12 µm | 10Å to 1 µm* |
Deposition rate | 0.5Å/s to 15Å/s | 10Å/s to 15Å/s | Depending on process parameters, up to ~2.5 Å/s | Depending on process parameters at least up to 0.7 Å/s | Depending on process parameters at least up to 1.3 Å/s. See conditions here | ~1.5 Å/s to 2 Å/s | 0.5, 1, or 2 Å/s |
Batch size |
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several small samples |
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Pumping time from wafer load |
Approx. 20 min |
Approx. 1.5 hour |
Approx. 1.5 hour |
Approx. 10 min |
Approx. 5 min plus 6 min transfer time |
Approx. 1,5 hour |
Approx. 15 min |
Allowed substrates |
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Allowed materials |
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Comment | * Thickness above 600 nm: ask for permission
It is possible to tilt the substrate. |
* Thickness above 600 nm: ask for permission.
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**Thickness above 120 nm: ask for permission
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* For cumulative deposition above 600 nm please write to metal@nanolab.dtu.dk to make sure there will be enough Al for your deposition
Aluminium deposition on ZEP520A for lift-off - comparison of thermal and e-beam evaporation
This is a small study of which aluminium deposition that is best for aluminium lift-off on ZEP520A resist and a very thin layer of aluminium (~20nm). The grain size is compared for the different methods.
The conclusion was that e-beam evaporation of aluminium at 15 Å/s gave the best result.
See details of the study here.
Aluminium deposition on AZ5214 for lift-off
Negative photolithography process is recomended.
Positive photolithography process from 1,5 µm is possible especially for thin layers of metal.
The more pattern the easyer lift.
It was tried (jan09) to lift 2.5 µm Al on 4.2µ negative resist on top of 11 µm Apox SiO2 in an acetone sonic-bath. The Al deposition process was done in steps evaporating 500 nm a time with 5 min pause and pressure down to at least 2E-6.
Roughness of thermally evaporated aluminium
A study by AFM was performed to examine Al films deposited with thermal evaporation in the Wordentec. See details here.