Specific Process Knowledge/Thin film deposition/Deposition of Silicon: Difference between revisions
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! Sputter ([[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]]) | ! Sputter ([[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Alcatel|Alcatel]]) | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Alcatel|Alcatel]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Lesker|Lesker]]) | |||
! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/III-V Dielectric evaporator|III-V Dielectric evaporator]]) | ! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/III-V Dielectric evaporator|III-V Dielectric evaporator]]) | ||
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| Sputter deposition of Si. '''Not''' recommended as first choice for Si deposition. | | Sputter deposition of Si. '''Not''' recommended as first choice for Si deposition. | ||
| Sputter deposition of Si. | |||
| E-beam evaporation of Si. | | E-beam evaporation of Si. | ||
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|None | |None | ||
|Can be doped with boron or phosphorus during deposition | |Can be doped with boron or phosphorus during deposition | ||
|None | |||
|None | |None | ||
|None | |None | ||
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|RF Ar clean | |RF Ar clean | ||
|None | |None | ||
|RF Ar clean | |||
|RF Ar clean | |RF Ar clean | ||
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|No defined limits | |No defined limits | ||
|10Å to 2000Å | |10Å to 2000Å | ||
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|10Å to 2500Å | |10Å to 2500Å | ||
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| About 6-8 nm/min. See more [[Specific_Process_Knowledge/Etch/IBE⁄IBSD_Ionfab_300/IBSD_of_Si|here.]] | | About 6-8 nm/min. See more [[Specific_Process_Knowledge/Etch/IBE⁄IBSD_Ionfab_300/IBSD_of_Si|here.]] | ||
|2Å/s to 8Å/s (see below). | |2Å/s to 8Å/s (see below). | ||
| Depends on process parameters, roughly 1 Å/s. | |||
|1Å/s to 5Å/s (see below). | |1Å/s to 5Å/s (see below). | ||
|- | |- | ||
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|Platen: 5-60 <sup>o</sup>C | |Platen: 5-60 <sup>o</sup>C | ||
|? | |? | ||
|Wafers can be heated to 100-200°C | |||
|20-250 <sup>o</sup>C | |20-250 <sup>o</sup>C | ||
|- | |- | ||
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|Not known | |Not known | ||
|Poor | |Poor | ||
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|Poor | |Poor | ||
|- | |- | ||
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|Not tested | |Not tested | ||
|Bad for pyrex, for other materials we do not know | |Bad for pyrex, for other materials we do not know | ||
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*Up to 1x4" wafers | *Up to 1x4" wafers | ||
*smaller pieces | *smaller pieces | ||
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* Up to 1x6" wafers | |||
* smaller pieces | |||
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* 2" | * 2" | ||
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*Same materials as on the allowed materials below | *Same materials as on the allowed materials below | ||
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* Silicon wafers | |||
* Quartz wafers | |||
* Pyrex wafers | |||
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* Silicon wafers | * Silicon wafers | ||
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* SU-8 | * SU-8 | ||
* Metals | * Metals | ||
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* Silicon oxide | |||
* Silicon (oxy)nitride | |||
* Photoresist | |||
* Metals | |||
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* III-V materials | * III-V materials | ||
* Silicon wafers | * Silicon wafers | ||
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| The system is used both for IBSD and IBE. Si deposition can only be performed when it is set up for IBSD. | | The system is used both for IBSD and IBE. Si deposition can only be performed when it is set up for IBSD. | ||
| This process is not running really stable nowadays. | | This process is not running really stable nowadays. | ||
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Revision as of 14:33, 20 October 2014
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PolySilicon can be deposited in several Danchip tools. Either it can be sputtered or be deposited in the PolySilicon furnace. In the chart below you can compare the two different deposition methods:
Deposition of PolySilicon using LPCVD
Danchip has two furnaces for deposition of LPCVD (Low Chemical Vapour Deposition) polysilicon: A 6" furnace (installed in 2011) for deposition of standard polySi, amorphous polySi and boron doped polySi on 100 mm or 150 mm wafers and a 4" furnace (installed in 1995) for deposition of standard polySi, amorphous polySi, boron- and phosphorous doped polySi on 100 mm wafers. In LabManager the two furnaces are named "Furnace: LPCVD Poly-Si (4") (B4)" and "Furnace: LPCVD Poly-Si (6") (E2)", respectively.
- Deposition of polysilicon using the 4" polysilicon furnace
- Deposition of polysilicon using the 6" polysilicon furnace
Deposition of Silicon using sputter deposition technique
At DANCHIP you can also deposit silicon using Wordentec, PVD co-sputter/evaporation or IBE Ionfab300 sputter systems. (There is also a Si sputter target in Alcatel, but the process is not running stable nowadays). One of the advantages here is that you can deposit on any material you like.
- Si deposition in IBE⁄IBSD Ionfab300
- Si sputter in Wordentec
- Si sputter in PVD co-sputter/evaporation
- Si sputter in Alcatel
Comparison of the methods for deposition of Silicon
Sputter (PVD co-sputter/evaporation) | 4" and 6" Furnace PolySi (Furnace LPCVD PolySi) | Sputter (Wordentec) | Sputter (IBE/IBSD Ionfab 300) | Sputter (Alcatel) | Sputter (Lesker) | E-beam evaporation (III-V Dielectric evaporator) | |
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General description | Sputter deposition of Si | LPCVD (low pressure cheimical vapour deposition) of polysilicon | Sputter deposition of Si. | Ion beam sputter deposition of Si. | Sputter deposition of Si. Not recommended as first choice for Si deposition. | Sputter deposition of Si. | E-beam evaporation of Si. |
Doping facility | None | Can be doped with boron or phosphorus during deposition | None | None | None | None | None |
Pre-clean | RF Ar clean | New wafers can go directly into the furnace. Processed wafers have to be RCA cleaned | RF Ar clean | None | RF Ar clean | RF Ar clean | |
Layer thickness | 10Å to about 3000Å | ~50Å to 2µm, if thicker layers are needed please ask the furnace team. | 10Å to about 3000Å | No defined limits | 10Å to 2000Å | 10Å to 2500Å | |
Deposition rate | Dependent on process parameters, but in the order of 1 Å/s. See more here |
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In the order of 1 Å/s, but dependendt on process parameters. See more here. |
About 6-8 nm/min. See more here. | 2Å/s to 8Å/s (see below). | Depends on process parameters, roughly 1 Å/s. | 1Å/s to 5Å/s (see below). |
Process temperature | Option: heating wafer up to 400 deg C | 560 oC (amorph) and 620 oC (poly) | ? | Platen: 5-60 oC | ? | Wafers can be heated to 100-200°C | 20-250 oC |
Step coverage | . | Good | . | Not known | Poor | Poor | |
Adhesion | . | Good for fused silica, silicon oxide, silicon nitride, silicon | . | Not tested | Bad for pyrex, for other materials we do not know | ||
Batch size |
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Allowed substrates |
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Allowed material |
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Only those above (under allowed substrates). |
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Comment | The system is used both for IBSD and IBE. Si deposition can only be performed when it is set up for IBSD. | This process is not running really stable nowadays. |