Specific Process Knowledge/Doping: Difference between revisions

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==Comparison method 1 and method 2 for the process==
==Comparison of different doping processed==


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Revision as of 15:41, 6 October 2014

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Doping your wafer

This page is about doping your wafer or making a thin film layer doped with boron, phosphor or Germane.



Comparison of different doping processed

Phosphor predep Boron predep PECVD doped thin film Doped Poly Si
Generel description Dopants introduced by diffusion from gas-phase (POCL) Dopants introduced by diffusion from solid source wafers Deposition of doped thin film (oxides or nitrides) Dopants introduced by in-situ doping of poly/amorphous Si
Parameter 1
  • A
  • B
  • A
  • B
  • A
  • B
  • A
  • B
Parameter 2
  • A
  • B
  • C
  • A
  • B
  • A
  • B
  • A
  • B
Substrate size
  • 100 mm wafers
  • 100 mm wafers
  • small samples
  • 50 mm wafers
  • 100 mm wafers
  • 100 mm wafers (Boron and Phosphor)
  • 150 mm wafers (only Boron)
Allowed materials
  • Silicon
  • Poly/amorphous silicon
  • Oxide
  • Nitride
  • Silicon
  • Poly/amorphous silicon
  • Oxide
  • Nitride
  • Silicon
  • Poly/amorphous silicon
  • Oxide
  • Nitride
  • Silicon
  • Poly/amorphous silicon
  • Oxide
  • Nitride



Ion implantation

Ion beam implantation cannot be done at Danchip. IBS offers ion-beam implantation as a service. See more at: http://www.ion-beam-services.com/about_us.htm