Specific Process Knowledge/Thin film deposition/Deposition of Aluminium: Difference between revisions

From LabAdviser
Reet (talk | contribs)
Reet (talk | contribs)
 
(One intermediate revision by the same user not shown)
Line 22: Line 22:
==E-beam evaporation of Aluminium==
==E-beam evaporation of Aluminium==


Aluminium can be deposited by e-beam assisted evaporation in the Wordentec, Physimeca and Temescal tools.
Aluminium can be deposited by e-beam assisted evaporation in the Wordentec and the two Temescal tools.
 


*[[/Al Ebeam evaporation in Temescal |E-beam evaporation of Al in Temescal]]
*[[/Al Ebeam evaporation in Temescal |E-beam evaporation of Al in Temescal]]
Line 155: Line 154:


|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
! Allowed substrates and materials
! Allowed materials


|  
|  

Latest revision as of 14:42, 19 January 2024

Feedback to this page: click here

Unless otherwise stated, this page is written by DTU Nanolab internal


Deposition of Aluminium

Aluminium can be deposited by e-beam evaporation, by sputtering and by thermal evaporation. In the chart below you can compare the different methods on the different deposition equipment.


Sputtering of Aluminium

Aluminium may be sputter deposited in either the Wordentec, the sputter-system (Lesker), or the cluster-based sputter system ("Sputter-System Metal-Oxide(PC1)" and "Sputter-System Metal-Nitride(PC3)"). See more in the matrix below.

E-beam evaporation of Aluminium

Aluminium can be deposited by e-beam assisted evaporation in the Wordentec and the two Temescal tools.


Thermal deposition of Aluminium

In the Wordentec and the Thermal evaporator aluminium can be deposited by thermal deposition. The two instruments are compared on the following page:


Comparison of Al deposition options


E-beam evaporation (E-beam evaporator (Temescal) and E-beam evaporator (10-pockets)) E-beam evaporation (Wordentec) Sputter deposition (Wordentec) Sputter deposition (Sputter-System (Lesker)) Sputter deposition (Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)) Thermal evaporation (Wordentec) Thermal evaporation (Thermal Evaporator)
General description

E-beam deposition of Aluminium

E-beam deposition of Aluminium

Sputter deposition of Aluminium

Sputter deposition of Aluminium

Sputter deposition of Aluminium

Aluminum deposition onto unexposed e-beam resist

Aluminum deposition onto unexposed e-beam resist

Pre-clean Ar ion etch (only in E-beam evaporator Temescal) RF Ar clean RF Ar clean
Layer thickness 10Å to 1 µm* 10Å to 1 µm* 10Å to ~0.5µm 10Å to ~0.5µm (very time consuming ) 10Å to ~0.5µm 10Å to 0.12 µm 10Å to 1 µm*
Deposition rate 1Å/s to 10Å/s 1Å/s to 15Å/s Depending on process parameters, up to ~2.5 Å/s Depending on process parameters at least up to 0.7 Å/s Depending on process parameters at least up to 1.3 Å/s. See conditions here ~1.5 Å/s to 2 Å/s 0.5, 1, or 2 Å/s
Batch size
  • Up to 4x6" or 3x8" wafers
  • smaller pieces
  • 24x2" wafers or
  • 6x4" wafers or
  • 6x6" wafers
  • 24x2" wafers or
  • 6x4" wafers or
  • 6x6" wafers
  • 1x4" wafer or
  • 1x6" wafer or

several small samples

  • up to 10x4" wafers or
  • up to 10x6" wafers
  • or many smaller samples
  • 24x2" wafers or
  • 6x4" wafers or
  • 6x6" wafers
  • Up to 3 x 4" wafers or one 6" or 8" wafer (limited uniformity on large substrates)
  • Many small chips
Pumping time from wafer load

Approx. 20 min

Approx. 1.5 hour

Approx. 1.5 hour

Approx. 10 min

Approx. 5 min plus 6 min transfer time

Approx. 1.5 hour

Approx. 15 min

Allowed materials

Almost any that does not degas. See the cross-contamination sheet.

Almost any that does not degas. See the cross-contamination sheet.

Almost any that does not degas. See the cross-contamination sheet.

  • Silicon wafers
  • and almost any
  • Almost that does not degas - see cross contamination sheets for PC1 and PC3
  • Special carrier for III-V materials.

Almost any that does not degas. See the cross-contamination sheet.

Almost any that does not degas. See the cross-contamination sheet.

Comment * Thickness above 600 nm: ask for permission

It is possible to tilt the substrate.

* Thickness above 600 nm: ask for permission.


**Thickness above 120 nm: ask for permission


* For cumulative deposition above 600 nm please write to metal@nanolab.dtu.dk to make sure there will be enough Al for your deposition

Aluminium deposition on ZEP520A for lift-off - comparison of thermal and e-beam evaporation

This is a small study of which aluminium deposition that is best for aluminium lift-off on ZEP520A resist and a very thin layer of aluminium (~20nm). The grain size is compared for the different methods.

The conclusion was that e-beam evaporation of aluminium at 15 Å/s gave the best result.

See details of the study here.

Aluminium deposition on AZ5214 for lift-off

Negative photolithography process is recomended.

Positive photolithography process from 1,5 µm is possible especially for thin layers of metal.

The more pattern the easyer lift.

It was tried (jan09) to lift 2.5 µm Al on 4.2µ negative resist on top of 11 µm Apox SiO2 in an acetone sonic-bath. The Al deposition process was done in steps evaporating 500 nm a time with 5 min pause and pressure down to at least 2E-6.

Roughness of thermally evaporated aluminium

A study by AFM was performed to examine Al films deposited with thermal evaporation in the Wordentec. See details here.