Specific Process Knowledge/Characterization/XRD/XRD Powder: Difference between revisions

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=The XRD Powder setup=
=The XRD Powder setup=
[[Image:machine front with on-off button.JPG|right|thumb|300px|The XRD Powder located in the basement of building 346 at Nanolab, Room 904.]]
The "XRD powder" is an Aeris Research edition benchtop X-ray diffractometer from Malvern Panalytical. It is meant for phase analysis of powders, is easy to use, and offers the option of making measurements while heating the sample in a N<sub><sub>2</sub></sub> atmosphere. The setup allows X-ray diffraction measurements with a Cu source in Bragg-Brentano mode (i.e., Theta-2Theta measurements where the incident and diffraction arms of the goniometer are coupled). We have a very limited selection of optics for this instrument, so there is little that the user can adjust.
The instrument has a 1D strip detector, which makes data acquisition very efficient, so you can measure your samples relatively quickly. The detector also has a fluorescence suppression option, so you can measure samples containing  for instance iron with the copper radiation.


The "XRD powder" is a benchtop X-ray diffractometer from Panalytical for phase analysis of powders. It is easy to use and offers the option of making measurements while heating the sample in a N<sub><sub>2</sub></sub> atmosphere. The instrument is located in the basement of building 346 at Nanolab, Room 904.  
Please contact the equipment responsible if you would like to mount the special sample holder for heating during the measurement.  
 


'''The user manual(s), user APV(s), technical information, and contact information can be found in LabManager:'''  
'''The user manual(s), user APV(s), technical information, and contact information can be found in LabManager:'''  


[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=463 XRD Powder in LabManager]
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=463 XRD Powder in LabManager] - requires login


==Software==
After making a measurement, you will need dedicated software for the data export and analysis.


====For data export====
==Process information==
On the Cleanroom drive you can find the DataViewer software, which is a very basic program that allows you to view your measurement results and export to other formats, e.g., csv or txt. To install DataViewer, go to the folder O:\CleanroomDrive\_Equipment\XRD Powder\XRD Aeris\XRDMP and click "setup" (XRDMP stands for XRD Measurement Program). This will open a menu that allows you to install both DataViewer and XRDMP Creator. Just choose to install DataViewer. XRDMP Creater is only needed if you have made an agreement with the equipment responsible that you are allowed to create your own measurement routines.


====For data analysis====
*Tips for choosing among the scan and hardware parameters including fluorescence suppression: [[/Measurement tips| XRD Powder measurement tips]]
We have a license for the software "HighScore" for Rietveld refinement, allowing quantification of the phase composition. This is so far only available on the support computer by the instrument.


====Additional software for measurements in a heated atmosphere====
*Malvern Panalytical has a large collection of webinars on XRD. You have to register to view them but the amount of email you receive afterwards is modest, so it's worth it in my opinion (Rebecca, July 2022). Some useful webinars include:
If you are going to make measurements in a heated N<sub><sub>2</sub></sub> atmosphere, you will need the Nambicon software to control the heater. It is found in the folder O:\CleanroomDrive\_Equipment\XRD Powder\XRD Aeris\Anton Paar Nambicon.
**[https://www.malvernpanalytical.com/en/learn/events-and-training/webinars/W20200604XRD.html Better XRD data quality with good sample preparation]
**A [https://www.malvernpanalytical.com/en/learn/events-and-training/webinars/W20210330XRD.html beginner’s tutorial] which also mentions sample preparation about half-way through and explains very briefly some of the issues that can arise from displaced samples, not having a thick enough sample layer, odd sized sample particles, etc.
===Software===
To adjust measurement parameters and analyze the data, you will need dedicated software which is described here: [[/XRD Powder software| XRD Powder software]]


==Equipment performance and process related parameters==
==Equipment performance and process related parameters==
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!style="background:silver; color:black;" align="center" width="60"|Purpose  
!style="background:silver; color:black;" align="center" width="60"|Purpose  
|style="background:LightGrey; color:black"| Crystal structure analysis and thin film thickness measurement
|style="background:LightGrey; color:black"| Crystal structure analysis
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|style="background:WhiteSmoke; color:black"|
*Phase ID
*Phase ID
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0.4 mm x 12 mm (Line)
0.4 mm x 12 mm (Line)
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!style="background:silver; color:black" align="center" valign="center" rowspan="5"|Goniometer
!style="background:silver; color:black" align="center" valign="center" rowspan="4"|Goniometer
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|style="background:LightGrey; color:black"|
Scanning mode
Scanning mode
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Fixed with rotation
Fixed with rotation
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|-
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Sample size
|style="background:WhiteSmoke; color:black"|
Powders
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Optics
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Optics
|style="background:LightGrey; color:black"|Incident side
|style="background:LightGrey; color:black"|Incident side
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|style="background:LightGrey; color:black"|Measurement temperature
|style="background:LightGrey; color:black"|Measurement temperature
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|style="background:WhiteSmoke; color:black"|
May be heated in N<sub><sub>2</sub></sub> using the Anton Paar sample holder assembly
May be heated in N<sub><sub>2</sub></sub> up to 500 °C
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|style="background:LightGrey; color:black"|Substrate size
|style="background:LightGrey; color:black"|Substrate size
|style="background:WhiteSmoke; color:black"|
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Latest revision as of 15:59, 13 May 2024

Feedback to this page: click here

Unless otherwise stated, this page is written by DTU Nanolab internal
All images and photos on this page belongs to DTU Nanolab

The XRD Powder setup

The XRD Powder located in the basement of building 346 at Nanolab, Room 904.

The "XRD powder" is an Aeris Research edition benchtop X-ray diffractometer from Malvern Panalytical. It is meant for phase analysis of powders, is easy to use, and offers the option of making measurements while heating the sample in a N2 atmosphere. The setup allows X-ray diffraction measurements with a Cu source in Bragg-Brentano mode (i.e., Theta-2Theta measurements where the incident and diffraction arms of the goniometer are coupled). We have a very limited selection of optics for this instrument, so there is little that the user can adjust. The instrument has a 1D strip detector, which makes data acquisition very efficient, so you can measure your samples relatively quickly. The detector also has a fluorescence suppression option, so you can measure samples containing for instance iron with the copper radiation.

Please contact the equipment responsible if you would like to mount the special sample holder for heating during the measurement.

The user manual(s), user APV(s), technical information, and contact information can be found in LabManager:

XRD Powder in LabManager - requires login


Process information

  • Malvern Panalytical has a large collection of webinars on XRD. You have to register to view them but the amount of email you receive afterwards is modest, so it's worth it in my opinion (Rebecca, July 2022). Some useful webinars include:

Software

To adjust measurement parameters and analyze the data, you will need dedicated software which is described here: XRD Powder software

Equipment performance and process related parameters

Equipment XRD Powder
Purpose Crystal structure analysis
  • Phase ID
  • Crystal Size
  • Crystallinity
X-ray generator

Maximum rated output

600 W

Rated tube voltage

40 kV

Rated tube current

15 mA

Type

Sealed tube

Target

Cu

Focus size

0.4 mm x 12 mm (Line)

Goniometer

Scanning mode

incident / receiver coupled

Goniomenter radius

145 mm

Minimum step size

0.001° (3.6")

Sample stage

Fixed with rotation

Optics Incident side
  • 0.04° soller slit
  • Ni and Cu filter
  • Divergence slits
  • Beam mask
Receiver side
  • 0.04° soller slit
  • Ni filter
Substrates Measurement temperature

May be heated in N2 up to 500 °C

Substrate size

Only for powders

Allowed materials

All materials have to be approved