Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-1: Difference between revisions

From LabAdviser
← Older edit
VisualWikitext
Jmli (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,416 edits
Jmli (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,416 edits
No edit summary
 
(22 intermediate revisions by 2 users not shown)
Line 1: Line 1:
'''Feedback to this page:  
'''Feedback to this page:  
[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Etch/DRIE-Pegasus click here]'''
[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Etch/DRIE-Pegasus click here]'''
[[Category: Equipment |Etch DRIE]]
[[Category: Equipment |Etch DRIE]]
[[Category: Etch (Dry) Equipment|DRIE]]
[[Category: Etch (Dry) Equipment|DRIE]]
{{contentbydryetch}}
<!--Checked for updates on 28/6-2023 - ok/jmli -->


= DRIE-Pegasus 1=
= DRIE-Pegasus 1=


[[Image:DRIE-Pegasus.jpg |frame|left|x300px|The DRIE-Pegasus 1 load lock and cassette loader in the Danchip cleanroom A-1]]
[[Image:DRIE-Pegasus.jpg |frame|left|x300px|The DRIE-Pegasus 1 load lock and cassette loader in the Nanolab cleanroom A-1. {{photo1}} ]]


'''The user manual(s), quality control procedure(s) and results, user APV(s), technical information and contact information can be found in LabManager:'''
'''The user manual(s), quality control procedure(s) and results, user APV(s), technical information and contact information can be found in LabManager:'''


Equipment info in [http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=265| LabManager]
Equipment info in [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=265| LabManager]


== Process information ==
== Process information ==


'''SPTS process notation'''
Describing a process recipe on the Pegasus may sometimes be difficult because of the great flexibility of the instrument. A compact and precise notation is therefore required for the recipes. Click [[Specific_Process_Knowledge/Etch/DRIE-Pegasus/Notation|here]] to find a short description of the official SPTS notation.


'''[[Specific Process Knowledge/Etch/DRIE-Pegasus/StandardRecipes|Standard recipes]]'''
'''[[Specific Process Knowledge/Etch/DRIE-Pegasus/StandardRecipes|Standard recipes]]'''
Line 41: Line 42:




'''Other etch processes'''
=== Other etch processes ===
 
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/DREM| DREM processes]]


*[[Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch|Nanostructure etches including nano1.42]]
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch|Continuous nanostructure etches including nano1.42]]


*[[Specific Process Knowledge/Etch/DRIE-Pegasus/DUVetch|Etch processes with DUV masks]]
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/DUVetch|Etch processes with DUV masks]]
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/Barc|BARC etches]]


*[[Specific Process Knowledge/Etch/DRIE-Pegasus/Isotropic|Isotropic etches]]
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/Isotropic|Isotropic etches]]


More processes, such as for DUV resist, are currently being developed, but they are not quite 'ready for publication' at LabAdviser so please contact Jonas (mailto:jml@danchip.dtu.dk) for more information.
More processes, such as for DUV resist, are currently being developed, but they are not quite 'ready for publication' at LabAdviser so please contact Jonas (mailto:jmli@dtu.dk) for more information.


  <!--  *[[Specific Process Knowledge/Etch/DRIE-Pegasus/slopedsidewalls|Etches that produce positively sloped sidewalls for imprinting purposes]] -->
  <!--  *[[Specific Process Knowledge/Etch/DRIE-Pegasus/slopedsidewalls|Etches that produce positively sloped sidewalls for imprinting purposes]] -->
Line 59: Line 60:
  <!-- *[[Specific Process Knowledge/Etch/DRIE-Pegasus/VeeryDeeep| Very deep etching]] -->
  <!-- *[[Specific Process Knowledge/Etch/DRIE-Pegasus/VeeryDeeep| Very deep etching]] -->


'''Advanced Processing - Henri Jansen style'''
=== Advanced Processing - Henri Jansen style ===
 
* [[Specific Process Knowledge/Etch/DRIE-Pegasus/Etch silicon nanostructures|Etch silicon nanostructures ]]
* [[Specific Process Knowledge/Etch/DRIE-Pegasus/Etch high aspect ratio silicon microstructures|Etch high aspect ratio silicon microstructures ]]
* [[Specific Process Knowledge/Etch/DRIE-Pegasus/Etch high aspect ratio silicon microstructures|Etch high aspect ratio silicon microstructures ]]
* [[Specific Process Knowledge/Etch/DRIE-Pegasus/Etch 3 dimensional silicon microstructures|Etch 3 dimensional silicon microstructures]]
* [[Specific Process Knowledge/Etch/DRIE-Pegasus/Etch 3 dimensional silicon microstructures|Etch 3 dimensional silicon microstructures]]
* [[Specific Process Knowledge/Etch/DRIE-Pegasus/Etch black silicon|Etch black silicon]]
* [[Specific Process Knowledge/Etch/DRIE-Pegasus/Etch black silicon|Etch black silicon]]
* [[/Using OES to monitor etch process|Using OES to monitor etch process]]
* [[Specific Process Knowledge/Etch/DRIE-Pegasus/Using OES to monitor etch process|Using OES to monitor etch process]]


'''Wafer bonding'''
=== Wafer bonding ===


To find information on how to bond wafers or chips to a carrier wafer, click [[Specific Process Knowledge/Etch/DryEtchProcessing/Bonding| here]].
To find information on how to bond wafers or chips to a carrier wafer, click [[Specific Process Knowledge/Etch/DryEtchProcessing/Bonding| here]].


'''Acceptance test'''
The instrument was opened for users in April 2010 when the acceptance test was signed. This was based on the performance of five standard recipes (A, B, C, D and SOI) that are further examined below. The acceptance test report is found [[Media:Pegasus_AcceptanceTest.pdf|here]].


'''Characterisation of etched trenches'''
'''Characterisation of etched trenches'''


Comparing differences in etched trenches requires a set of common parameters for each trench. Click [[Specific Process Knowledge/Etch/DRIE-Pegasus/TrenchCharacterisation|here]] to find more information about the parameters used on the DRIE-Pegasus process development.
Comparing differences in etched trenches requires a set of common parameters for each trench. Click [[Specific Process Knowledge/Etch/DRIE-Pegasus/TrenchCharacterisation|'''HERE''']] to find more information about the parameters used on the DRIE-Pegasus process development.
 
'''Material from SPTS'''
 
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/SPTSdocs|Hardware and process applications]]
 
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/FAQ|Miscellaneous information]]
 
'''Internal Danchip Process log'''
 
Process log at Danchip [http://labintra.danchip.dtu.dk/index.php/Main_Page/Process_Logs/jmli/Pegasus]


==Equipment performance and process related parameters==


{| border="2" cellspacing="0" cellpadding="2"
'''Internal Nanolab Process log for Pegasus 1'''


!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment
Process log at Nanolab [http://labintra.nanolab.dtu.dk/index.php/Main_Page/Process_Logs/jmli/Pegasus]
|style="background:WhiteSmoke; color:black"|<b>DRIE-Pegasus</b>
|-
!style="background:silver; color:black;" align="center" width="80"|Purpose
|style="background:LightGrey; color:black"| Dry etch of
|style="background:WhiteSmoke; color:black"|
* Silicon
* Barc
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Performance
|style="background:LightGrey; color:black"|Etch rates
|style="background:WhiteSmoke; color:black"|
* Standard processes A and B up to 15 µm/min depending on etch load and feature size
* Other processes: Any number from 200 nm/min to 10 µm/min
|-
|style="background:LightGrey; color:black"|Uniformity
|style="background:WhiteSmoke; color:black"|
* For standard processes better than 3 % across a 150 mm wafer.
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="4"|Process parameter range
|style="background:LightGrey; color:black"|RF powers
|style="background:WhiteSmoke; color:black"|
* Coil Power 5 kW
* Platen power 300/500 W (HF/LF)
|-
|style="background:LightGrey; color:black"|Gas flows
|style="background:WhiteSmoke; color:black"|
* SF<sub>6</sub>: 0 to 1200 sccm
* O<sub>2</sub>: 0 to 200 sccm
* C<sub>4</sub>F<sub>8</sub>: 0 to 400 sccm
* Ar: 0 to 283 sccm
|-
|style="background:LightGrey; color:black"|Pressure and temperature
|style="background:WhiteSmoke; color:black"|
* Pressure range 4 to 250 mTorr
* Temperature range -20 to 30 degrees C
|-
|style="background:LightGrey; color:black"|Process options
|style="background:WhiteSmoke; color:black"|
* Bosch processes with etch and dep cycles possibly split into three individually controllable parts
* Parameter ramping during process steps
* SOI option to reduce notching at buried
|-


!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates
{{global:Infobox Software/MediaWiki}}
|style="background:LightGrey; color:black"|Batch size
|style="background:WhiteSmoke; color:black"|
*<nowiki>#</nowiki> small samples on carriers
*<nowiki>#</nowiki> 50 mm wafers: Bonded to carriers
*<nowiki>#</nowiki> 100 mm wafers: Up to 18 wafers in a batch process
*<nowiki>#</nowiki> 150 mm wafers: 1 wafer
|-
| style="background:LightGrey; color:black"|Allowed materials
|style="background:WhiteSmoke; color:black"|
* Silicon wafers
* Quartz wafers need a (semi)conducting layer for clamping
|-
| style="background:LightGrey; color:black"|Possible masking materials
|style="background:WhiteSmoke; color:black"|
* AZ photoresist
* zep resist
* DUV stepper resist (barc + krf)
* Oxides and nitrides
* Aluminium (only very mild processes such as process C and nanoetches)
|}

Latest revision as of 12:00, 28 June 2023

Feedback to this page: click here

Unless otherwise stated, the content of this page was created by the dry etch group at DTU Nanolab


DRIE-Pegasus 1

The DRIE-Pegasus 1 load lock and cassette loader in the Nanolab cleanroom A-1. Photo: DTU Nanolab internal

The user manual(s), quality control procedure(s) and results, user APV(s), technical information and contact information can be found in LabManager:

Equipment info in LabManager

Process information

Standard recipes

Hardware changes

A few hardware modifications have been made on the Pegasus since it was installed in 2010. The changes are listed below.


Other etch processes

More processes, such as for DUV resist, are currently being developed, but they are not quite 'ready for publication' at LabAdviser so please contact Jonas (mailto:jmli@dtu.dk) for more information.



Advanced Processing - Henri Jansen style

Wafer bonding

To find information on how to bond wafers or chips to a carrier wafer, click here.


Characterisation of etched trenches

Comparing differences in etched trenches requires a set of common parameters for each trench. Click HERE to find more information about the parameters used on the DRIE-Pegasus process development.


Internal Nanolab Process log for Pegasus 1

Process log at Nanolab [1]

Template:Global:Infobox Software/MediaWiki

Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Etch/DRIE-Pegasus/Pegasus-1&oldid=46757"