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''This section is written by DTU Nanolab internal if nothing else is stated.''
[[Category:314]]
[[Category:314]]
[[Category:314-Microscopy]]
[[Category:314-Microscopy]]
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= FEI Titan 80-300 ATEM =
= FEI Titan 80-300 ATEM =


Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. It is equipped with the FEI X-FEG gun and monochromator, which allows experiments at 120 kV or 300 kV acceleration voltage. With the momochromator, the energy spread can be adjusted between about 1 eV and below 0.2 eV. Furthermore, a CEOS CESCOR Cs-corrector of the condenser lens system is installed. The objective lens has the super-twin (S-Twin) pole piece with 5.2 mm pole gap (Cs about 1.2 mm). The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. For TEM, a Gatan Ultrascan US1000 CCD (2048x2048 px) is installed, for STEM, a high-angle annular dark field detector (HAADF) or BF/DF detector of the GIF system can be used.</ br>
Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. It is equipped with the FEI X-FEG gun and monochromator, which allows experiments at 120 kV or 300 kV acceleration voltage. With the momochromator, the energy spread can be adjusted between about 1 eV and below 0.2 eV. Furthermore, a CEOS CESCOR Cs-corrector of the condenser lens system is installed. The objective lens has the super-twin (S-Twin) pole piece with 5.2 mm pole gap (Cs about 1.2 mm). The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. For TEM, a Gatan Ultrascan US1000 CCD (2048x2048 px) is installed, for STEM, a high-angle annular dark field detector (HAADF) or BF/DF detector of the GIF system can be used.<br />


For energy dispersive X-ray spectroscopy (EDS) an Oxford windowless X-Max 80TLE detector is installed, which is running Oxford Aztec analysis software. For electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM), the microscope is equipped with a Gatan Tridiem 865 GIF and a Gatan Ultrascan US1000 CCD (2048x2048 px). The microscope can be used for elemental analysis from regions that are as small as 1 nm and is specifically suited for EDS and EELS mapping (Gatan Digiscan). Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios).</ br>
For energy dispersive X-ray spectroscopy (EDS) an Oxford windowless X-Max 100TLE detector is installed, which is running Oxford Aztec analysis software. For electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM), the microscope is equipped with a Gatan Tridiem 865 GIF and a Gatan Ultrascan US1000 CCD (2048x2048 px). The microscope can be used for elemental analysis from regions that are as small as 1 nm and is specifically suited for EDS and EELS mapping (Gatan Digiscan). Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios).<br />


This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens. <br />
This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens. <br />
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= Calibration =
= Calibration =


*[[media:Calibration_collection angle_3Feb10.docx|Calibration_collection angle_3Feb10]]
*[[media:ATEM_collection-angles.xlsx‎ |GIF collection angles (20220209)]]
*Magnification calibration cameras
*Magnification calibration cameras
*Convergence angles STEM
*Convergence angles STEM


= Process information =
= Process information =
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Processes:
Processes:
*Monochromated STEM-EELS for low-loss experiments
*Monochromated STEM-EELS for low-loss experiments
<br />


= Tips and Tricks =
= Tips and Tricks =

Latest revision as of 09:10, 27 June 2023

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This section is written by DTU Nanolab internal if nothing else is stated.

Titan ATEM in building 314.

FEI Titan 80-300 ATEM

Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. It is equipped with the FEI X-FEG gun and monochromator, which allows experiments at 120 kV or 300 kV acceleration voltage. With the momochromator, the energy spread can be adjusted between about 1 eV and below 0.2 eV. Furthermore, a CEOS CESCOR Cs-corrector of the condenser lens system is installed. The objective lens has the super-twin (S-Twin) pole piece with 5.2 mm pole gap (Cs about 1.2 mm). The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. For TEM, a Gatan Ultrascan US1000 CCD (2048x2048 px) is installed, for STEM, a high-angle annular dark field detector (HAADF) or BF/DF detector of the GIF system can be used.

For energy dispersive X-ray spectroscopy (EDS) an Oxford windowless X-Max 100TLE detector is installed, which is running Oxford Aztec analysis software. For electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM), the microscope is equipped with a Gatan Tridiem 865 GIF and a Gatan Ultrascan US1000 CCD (2048x2048 px). The microscope can be used for elemental analysis from regions that are as small as 1 nm and is specifically suited for EDS and EELS mapping (Gatan Digiscan). Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios).

This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens.

Sample holders

The default specimen holders are a Fischione single-tilt tomography holder and an FEI double-tilt holder, which should be in the pumping station. The lab has also other specimen holders used for various application e.g. heating (furnace and MEMS-based), cooling, biasing and tomography. For information on the various specimen holders see HERE

Who may operate the Titan ATEM

In order to start training on the Titan ATEM you must by fully trained in the Tecnai TEM. Most of the basic operation on the Titan ATEM is the same as on the Tecnai with the added complexity of the aberration corrector and the monochromator.

When you have demonstrated a high level of familiarity with the microscope you are allowed to book it via LabManager and use it 24/7.

Booking

Booking on the ATEM is done by the users in accordance to the booking rules. Booking rules can be found in LabManager under "Documents" for the ATEM.

Further information

Titan ATEM in LabManager

Calibration

Process information

The following techniques and processes are available on the microscope (list isn't complete):


Techniques:

Processes:

  • Monochromated STEM-EELS for low-loss experiments


Tips and Tricks

Here you can find some help to solve small issues on the microscope. Let us know, if you have other suggestions.


Reference material

L. Reimer, Transmission Electron Microscopy - Physics of image formation and microanalysis (Springer, 1997).

David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009).