Specific Process Knowledge/Thermal Process/C3 Anneal-bond furnace: Difference between revisions
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[[Category: Equipment |Thermal C3]] | [[Category: Equipment |Thermal C3]] | ||
[[Category: Thermal process|C3]] | [[Category: Thermal process|C3]] | ||
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==Anneal-bond furnace (C3)== | ==Anneal-bond furnace (C3)== | ||
[[Image:C3.JPG|thumb|300x300px|Anneal-bond furnace (C3). Positioned in cleanroom B-1]] | [[Image:C3.JPG|thumb|300x300px|Anneal-bond furnace (C3). Positioned in cleanroom B-1/ Photo: DTU Nanolab internal]] | ||
The Anneal-bond furnace (C3) is a Tempress horizontal furnace for oxidation and annealing of new and processed (e.g. bonded) silicon wafers. O<sub>2</sub>) is used as an oxidant for dry oxidation, and for wet oxidation water vapour is being generated by a bubbler. | The Anneal-bond furnace (C3) is a Tempress horizontal furnace for oxidation and annealing of new and processed (e.g. bonded) silicon wafers. O<sub>2</sub>) is used as an oxidant for dry oxidation, and for wet oxidation water vapour is being generated by a bubbler. | ||
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Oxidation: | Oxidation: | ||
*Dry oxidation using O<sub>2</sub> | *Dry oxidation using O<sub>2</sub> | ||
*Wet oxidation using H<sub>2</sub>O generated by a bubbler | *Wet oxidation using H<sub>2</sub>O vapour generated by a bubbler | ||
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!style="background:silver; color:black" align="center"|Performance | !style="background:silver; color:black" align="center"|Performance | ||
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*Dry oxide:~ 0 nm to 300 nm (it takes too long to grow thicker dry oxide layers) | *Dry oxide:~ 0 nm to 300 nm (it takes too long to grow thicker dry oxide layers) | ||
*Wet oxide: ~ 0 nm to 3 µm (23 hours oxidation at 1100 <sup>o</sup>C) | *Wet oxide: ~ 0 nm to 3 µm (23 hours wet oxidation at 1100 <sup>o</sup>C) | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | ||
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|style="background:LightGrey; color:black"|Substrate materials allowed | |style="background:LightGrey; color:black"|Substrate materials allowed | ||
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*Silicon wafers | *Silicon wafers | ||
*Silicon wafers with layers of silicon oxide or silicon | *Silicon wafers with layers of silicon oxide or silicon nitride | ||
*Wafers from the LPCVD furnaces | *Wafers from the LPCVD furnaces | ||
*Wafers from PECVD4 | *Wafers from PECVD4 |
Latest revision as of 14:22, 31 January 2023
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Anneal-bond furnace (C3)
The Anneal-bond furnace (C3) is a Tempress horizontal furnace for oxidation and annealing of new and processed (e.g. bonded) silicon wafers. O2) is used as an oxidant for dry oxidation, and for wet oxidation water vapour is being generated by a bubbler.
This furnace is the third tube in the furnace C-stack positioned in cleanroom B-1.
In this furnace it is allowed oxidize and anneal new wafers without doing an RCA clean first. Also silicon wafers from PECVD4 and wafers without any metal coming from PECVD3 and bonded wafers comming directly from the Wafer Bonder 02 (assuming they were clean and not have been exposed to any metal when entering wafer bonder) can be processed in the furnace without an RCA cleaning. Check the cross contamination information in LabManager before you use the furnace.
The user manual, technical information and contact information can be found in LabManager:
Process knowledge
Purpose |
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Annealing:
Oxidation:
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Performance | Film thickness |
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Process parameter range | Process temperature |
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Process pressure |
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Gas flows |
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Substrates | Batch size |
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Substrate materials allowed |
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