Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch/nano121: Difference between revisions
New page: == The nano1.21 recipe == {| border="2" cellpadding="2" cellspacing="1" |+ '''Recipe nano1.21''' |- ! rowspan="6" align="center"| Recipe | Gas | C<sub>4</sub>F<sub>8</sub> 75 sccm, SF<su... |
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== The nano1.21 recipe == | == The nano1.21 recipe == | ||
<!-- revised 1/6-2015 by jmli --> | |||
{| border="2" cellpadding="2" cellspacing="1" | {| border="2" cellpadding="2" cellspacing="1" | ||
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! rowspan="6" align="center"| Recipe | ! rowspan="6" align="center"| Recipe | ||
| Gas | | Gas | ||
| C<sub>4</sub>F<sub>8</sub> 75 sccm, SF<sub>6</sub> | | C<sub>4</sub>F<sub>8</sub> 75 sccm, SF<sub>6</sub> 38 sccm | ||
|- | |- | ||
| Pressure | | Pressure | ||
Line 31: | Line 38: | ||
|- | |- | ||
| Mask | | Mask | ||
| | | 211 nm zep etched down to 74 nm | ||
|- | |- | ||
|} | |} | ||
<gallery caption="The results of the nano1. | <gallery caption="The results of the nano1.21 recipe" widths="250" heights="200" perrow="3"> | ||
image:WF_2E06_mar23B-030.jpg|The 30 nm trenches | image:WF_2E06_mar23B-030.jpg|The 30 nm trenches | ||
image:WF_2E06_mar23B-060.jpg|The 60 nm trenches | image:WF_2E06_mar23B-060.jpg|The 60 nm trenches | ||
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C4F8 75 sccm, SF6 38 sccm, 4 mTorr, Strike 3 secs @ 15 mTorr, 800 W CP, 50 W PP, -10 degs, 120 secs | C4F8 75 sccm, SF6 38 sccm, 4 mTorr, Strike 3 secs @ 15 mTorr, 800 W CP, 50 W PP, -10 degs, 120 secs | ||
</gallery> | </gallery> | ||
{| {{table}} | |||
| align="center" style="background:#f0f0f0;"|'''Nominal trench line width''' | |||
| align="center" style="background:#f0f0f0;"|'''''' | |||
| align="center" style="background:#f0f0f0;"|'''30''' | |||
| align="center" style="background:#f0f0f0;"|'''60''' | |||
| align="center" style="background:#f0f0f0;"|'''90''' | |||
| align="center" style="background:#f0f0f0;"|'''120''' | |||
| align="center" style="background:#f0f0f0;"|'''150''' | |||
| align="center" style="background:#f0f0f0;"|'''Avg''' | |||
| align="center" style="background:#f0f0f0;"|'''Std''' | |||
|- | |||
| Etch rates||nm/min||168||182||185||189||191||183||9 | |||
|- | |||
| Sidewall angle||degs||91||91||91||91||90||91||0 | |||
|- | |||
| CD loss||nm/edge||7||-3||-3||-25||-26||-10||15 | |||
|- | |||
| CD loss foot||nm/edge||12||9||10||-11||1||4||9 | |||
|- | |||
| Bowing||||9||6||4||5||7||6||2 | |||
|- | |||
| Bottom curvature||||-47||-34||-34||-26||-19||-32||10 | |||
|- | |||
| zep||nm/min||||||||||||69|| | |||
|- | |||
| | |||
|} | |||
<!-- revised --> |
Latest revision as of 10:23, 9 August 2022
The nano1.21 recipe
Recipe | Gas | C4F8 75 sccm, SF6 38 sccm |
---|---|---|
Pressure | 4 mTorr, Strike 3 secs @ 15 mTorr | |
Power | 800 W CP, 50 W PP | |
Temperature | -10 degs | |
Hardware | 100 mm Spacers | |
Time | 120 secs | |
Conditions | Run ID | 1925 |
Conditioning | Sequence: Oxygen clean, MU tests, processes, no oxygen between runs | |
Mask | 211 nm zep etched down to 74 nm |
-
The 30 nm trenches
-
The 60 nm trenches
-
The 90 nm trenches
-
The 120 nm trenches
-
The 150 nm trenches
Nominal trench line width | ' | 30 | 60 | 90 | 120 | 150 | Avg | Std |
Etch rates | nm/min | 168 | 182 | 185 | 189 | 191 | 183 | 9 |
Sidewall angle | degs | 91 | 91 | 91 | 91 | 90 | 91 | 0 |
CD loss | nm/edge | 7 | -3 | -3 | -25 | -26 | -10 | 15 |
CD loss foot | nm/edge | 12 | 9 | 10 | -11 | 1 | 4 | 9 |
Bowing | 9 | 6 | 4 | 5 | 7 | 6 | 2 | |
Bottom curvature | -47 | -34 | -34 | -26 | -19 | -32 | 10 | |
zep | nm/min | 69 | ||||||