Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/Etch slow
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Etch slow (this was tested in 2012)
This process development is going on to find an etch recipe that is so gentle that the resist masking material can be removed with acetone + ultrasound within hopefully 10min. This is important when a metal is to be etched as this cannot withstand plasma ashing (to remove reist mask) after the etch.
Parameter | Si etch test1 | Si etch test2 | Si etch test3 |
---|---|---|---|
Important note | This recipe must only be run for 5 min, otherwise the beam acc. current will incrase above 20 | ||
Neutalizer current [mA] | 450 | 250 | 450 |
RF Power [W] | 1200 | 1000 | 1200 |
Beam current [mA] | 400 | 200 | 400 |
Beam voltage [V] | 400 | 200 | 400 |
Beam accelerator voltage | 400 | 200 | 400 |
Ar flow to neutralizer [sccm] | 6.0 | 6.0 | 6.0 |
Ar flow to beam [sccm] | 6.0 | 6.0 | 6.0 |
Rotation speed [rpm] | 20 | 20 | 20 |
Stage angle [degrees] | 10 | 10 | 10 |
Platen temp. [dg. Celcius] | 15 | 15 | 15 |
He cooling pressure [mTorr] | 37.5 | 37.5 | 37.5 |
Etch material | Si | Si | Si |
Results | vvv | vvv | vvv |
Etch time [min] | 40 | 40 | 7:15 |
Etch rate in Si [nm/min] | 19.7 | 3.58 | 19.3 |
Total time in Acetone + ultrasound [min] | 17 | 10 | 20 |
Was the resist completely removed after acetone + ultrasound? | no | yes | yes (almost) |