THIS PAGE IS UNDER CONSTRUCTION

Calibration wafers

Danchip has three calibration wafers for the KLA-Tencor Surfscan. The calibration wafers are 6" silicon wafer with a number of polystyrene latex spheres (PSL) uniformily spread over the surface. Diameter of PSL spheres:

0.204 µm spheres
1.112 µm spheres
4.000 µm spheres

Uniformity check

Acceptance criterion:

10 scans are done on each of the three PSL calibration wafers. Load/unload to the cassette every time. The the repeatbility of +/- 1σ should be less then 1%.

Results

0.204 µm PSL spheres:

Measured average diameter: 0.2063 µm Non-uniformity: 0,24%

Average number of particles: 7065 Non-unifomity: 0.11%

1.112 µm PSL spheres:

Measured average diameter: 1.100 µm Non-uniformity: 0%

Average number of particles: 7427 Non-unifomity: 0.20%

4.000 µm PSL spheres:

Measured average diameter: 3.970 µm Non-uniformity: 0,24%

Average number of particles: 7101 Non-unifomity: 0.10%

Handling test

Acceptance criterion:

Run a cassette of 25 wafers. The machine should be able to error-free handle the cassette 40 times, i.e. it should be able to handle 1000 wafers withot faling.

Results

6" cassette":

A cassette of 25 wafers was handled 40 times over night, i.e. the acceptance criterion was meet.

4" and 8" cassette:

A cassette of 25 wafers was handled two times. The scanning was then stopped to save time as we do not expect handling of more cassettes to caused problem.-s