Specific Process Knowledge/Characterization/XPS/Processing/ALDSandwich1

From LabAdviser
< Specific Process Knowledge‎ | Characterization‎ | XPS‎ | Processing
Revision as of 08:40, 1 October 2018 by Jmli (talk | contribs) (Created page with "= XPS analysis of ALD deposited layers = == How to fit data with multiple spectra and levels == ; Use one processing grid to hold all spectra to be fitted. : Each processing...")
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)

XPS analysis of ALD deposited layers

How to fit data with multiple spectra and levels

Use one processing grid to hold all spectra to be fitted.
Each processing grid has a peak table that holds all the peaks for each level. Making depth profiles cannot be made across processing grids. Survey spectra must be kept in separate grids - if not the peak table of the survey spectrum will get mixed with the high resolution spectra.
Do not mix snapshot and scanned spectra in processing grid
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/XPS/Processing/ALDSandwich1&oldid=29936"