Specific Process Knowledge/Characterization/Sample imaging

The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, an AFM and three SEM's.

In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced FEI SEM that is capable of taking high magnification images of any sample or wafer.

	Optical microscopes	SEM	AFM	Profiler
Magnification
Depth of focus