Specific Process Knowledge/Etch/Etching of Silicon Nitride: Difference between revisions

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Silicon nitride can be etched using either wet chemistry or dry etch equipment. Wet chemistry is mainly used to remove all the nitride on the surface (backside and frontside) of a wafer. Dry etching etches one side at a time and can be used to etch structures with several masking materials.
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Revision as of 08:28, 22 April 2013

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Comparing silicon nitride etch methods at Danchip

There are a broad varity of silicon nitride etch methods at Danchip. The methodes are compared here to make it easier for you to compare and choose the one that suits your needs.



Compare the methods for Silicon Nitride etching

Wet Silicon Nitride Etch BHF RIE (Reactive Ion Etch) AOE (Advanced Oxide Etch) IBE/IBSD Ionfab 300
Generel description
  • Isotropic etch
  • Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si3N4/Si (>100) and Si3N4/SiO2 (>20) @ 180 C.
  • Isotropic etch
  • Well suited for removing all PECVD nitride on a wafer surface (nitride strip) without a mask. Etches LPCVD nitride very slowly
  • Anisotropic etch: vertical sidewalls
  • Anisotropic etch: vertical sidewalls
  • Deep etch
  • Primarily for pure physical etch by sputtering with Ar-ions
Possible masking materials
  • Silicon Oxide
  • PolySilicon
  • Photoresist
  • PolySilicon
  • Blue film
  • Photoresist
  • DUV resist
  • E-beam resist
  • Silicon Oxide
  • Silicon Nitride
  • Aluminium
  • Metals if they cover less than 5% of the wafer area (ONLY RIE2!)
  • Photoresist
  • DUV resist
  • E-beam resist
  • Silicon Oxide
  • Silicon Nitride
  • Aluminium
  • Chromium (please try to avoid it)
  • Any material that is accepted in the machine
Etch rate range
  • Si3N4 @ 180 oC: ~84 Å/min
  • Si3N4 @ 160 oC: ~60 Å/min
  • PECVD nitride: ~400-1000 Å/min
  • Typically 40-50 nm/min can be increased or decreased by using other recipe parameters.
  • Process dependent.
  • Tested once to ~60nm/min
  • Process dependent.
  • Has not been tested yet.
Substrate size
  • #1-25 100 mm wafers
  • #1-25 100mm wafers in our 100mm bath
  • As many small samples as can be fitted on the 100mm carrier.
  • #1 100mm wafer (or smaller with carrier)
  • #1 150mm wafer (only when the system is set up for 150mm)
  • As many small samples as can be fitted on a 100mm wafer
  • #1 50 mm wafer fitted on a 100mm wafer
  • #1 100 mm wafer
  • #1 150 mm wafers (only RIE2 when set up to 150mm)
  • As many samples as can be securely fitted on a up to 200mm wafer
  • #1 50 mm wafer with special carrier
  • #1 100 mm wafer with special carrier
  • #1 150 mm wafers with special carrier
  • #1 200 mm wafer
Allowed materials
  • Silicon
  • Silicon Oxide
  • Silicon Nitride
  • Silicon Oxynitride
  • Silicon
  • Silicon Oxide
  • Silicon Nitride
  • Silicon Oxynitride
  • Photoresist
  • Blue film
  • Silicon
  • Silicon Oxide
  • Silicon Nitride
  • Silicon Oxynitride
  • Photoresist
  • E-beam resists
  • DUV resists
  • Other metals if they cover less than 5% of the wafer area (ONLY RIE2!)
  • Quartz/fused silica
  • Silicon
  • Silicon Oxide
  • Silicon Nitride
  • Silicon Oxynitride
  • Photoresist
  • E-beam resists
  • DUV resists
  • Aluminium
  • Chromium (try to avoid it)
  • Quartz/fused silica
  • Silicon
  • Silicon oxides
  • Silicon (oxy)nitrides
  • Metals from the +list
  • Metals from the -list
  • Alloys from the above list
  • Stainless steel
  • Glass
  • III-V materials
  • Resists
  • Polymers
  • Capton tape