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This project aims to facilitate a reliable creation of smooth and slender nanostructures to demonstrate the ability in some state-of-the-art and novel NEMS applications include 1) resonators and sensors for physical and bio-chemical sensing down to the molecular level both because of the much reduced mass, 2) nanowires for novel transistors and photovoltaics increasingly exploring quantum effects starting at the sub-50nm level, 3) nanostructures for photonics (around the wavelength of the guided photons) and next generation storage (10nm and below), 4) black silicon for high area catalyzed reaction chambers and photovoltaics, 5) through wafer vias for packaging applications, and 6) nano imprint lithography (NIL) masters. The approach is to first create nanoscale silicon patterns using the modern high density plasma tool (SPTS DRIE-Pegasus). This structure is then annealed in pure hydrogen at high temperature (1100<sup>o</sup>C) and high vacuum (10E-6 mbar) using an annealling tool (Annealsys RTP-150-HV). The quantitative analysis on the sidewall roughness reduction will be measured using scanning electron microscopes (SEM) and atomic force microscope (AFM).
This project aims to facilitate a reliable creation of smooth and slender nanostructures to demonstrate the ability in some state-of-the-art and novel NEMS applications include 1) resonators and sensors for physical and bio-chemical sensing down to the molecular level both because of the much reduced mass, 2) nanowires for novel transistors and photovoltaics increasingly exploring quantum effects starting at the sub-50nm level, 3) nanostructures for photonics (around the wavelength of the guided photons) and next generation storage (10nm and below), 4) black silicon for high area catalyzed reaction chambers and photovoltaics, 5) through wafer vias for packaging applications, and 6) nano imprint lithography (NIL) masters. The approach is to first create nanoscale silicon patterns using the modern high density plasma tool (SPTS DRIE-Pegasus). This structure is then annealed in pure hydrogen at high temperature (1100<sup>o</sup>C) and high vacuum (10E-6 mbar) using an annealling tool (Annealsys RTP-150-HV). The quantitative analysis on the sidewall roughness reduction will be measured using scanning electron microscopes (SEM) and atomic force microscope (AFM).
==Publications==
===Name of publication 1 made in this project===
Reference and link to the publication
*[[/Process flow form|Process flow(s) relevant to this publication including links to Process development made in connection to this publication this is describes in either LabAdviser or Process2Share]]
===Name of publication2 made in this project===
Reference and link to the publication
*[[/Process flow form|Process flow(s) relevant to this publication including links to Process development made in connection to this publication this is describes in either LabAdviser or Process2Share]]
===Name of publication3 made in this project===
Reference and link to the publication
*[[/Process flow form|Process flow(s) relevant to this publication including links to Process development made in connection to this publication this is describes in either LabAdviser or Process2Share]]