LabAdviser/314/Microscopy 314-307/SEM/Nova/Micro 4-point probe: Difference between revisions
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ρ = 2aπs*V/I | ρ = 2aπs*V/I | ||
where a is the thickness correction factor for thicknesses t equal to or less than half the probe spacing (t | where a is the thickness correction factor for thicknesses t equal to or less than half the probe spacing (t/s < 0.5): | ||
Substituting Eq. 2.9 in Eq. 2.8 we get: | Substituting Eq. 2.9 in Eq. 2.8 we get: | ||