Specific Process Knowledge/Thin film deposition/Temescal: Difference between revisions

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Note that to date (July 2018) we have processes available for deposition of Al, Cr, Au, Ni, Pd, Ag, Ti, and W as well as Ru. More will be available as they are requested, e.g., Nb is expected in the early fall of 2018.
Note that to date (July 2018) we have processes available for deposition of Al, Cr, Au, Ni, Pd, Ag, Ti, and W as well as Ru. More will be available as they are requested, e.g., Nb is expected in the early fall of 2018.


==Equipment performance and process related parameters==
==Equipment performance and process related parameters for the Temescal E-beam evaporator==


{| border="2" cellspacing="0" cellpadding="2"  
{| border="2" cellspacing="0" cellpadding="10"  
 
!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment
|style="background:WhiteSmoke; color:black"|<b>Equipment 1</b>
|style="background:WhiteSmoke; color:black"|<b>Equipment 2</b>
|-
|-
!style="background:silver; color:black;" align="center" width="60"|Purpose  
!style="background:silver; color:black;" align="left"|Purpose  
|style="background:LightGrey; color:black"|  
|style="background:LightGrey; color:black"|Deposition of metals ||style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*E-beam evaporation of metals
*Purpose 1
*Line-of-sight deposition
*Purpose 2
*Possible to tilt sample
|style="background:WhiteSmoke; color:black"|
*Possible to ion clean samples
*Purpose 1
*Possible to modify deposition by Ar ion bombardment
*Purpose 2
*Purpose 3
|-
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Performance
!style="background:silver; color:black" align="left" valign="top" rowspan="2"|Performance
|style="background:LightGrey; color:black"|Response 1
|style="background:LightGrey; color:black"|Film thickness||style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*10Å - 1µm* (for some materials) 
*Performance range 1
*Performance range 2
|style="background:WhiteSmoke; color:black"|
*Performance range 1
*Performance range 2
*Performance range 3
|-
|-
|style="background:LightGrey; color:black"|Response 2
|style="background:LightGrey; color:black"|Deposition rate
|style="background:WhiteSmoke; color:black"|
*Performance range
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Performance range
*0.5Å/s - 10Å/s
|-
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Process parameter range
!style="background:silver; color:black" align="left" valign="top" rowspan="2"|Process parameter range
|style="background:LightGrey; color:black"|Parameter 1
|style="background:LightGrey; color:black"|Process Temperature
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Range
*Approximately room temperature
|style="background:WhiteSmoke; color:black"|
*Range
|-
|-
|style="background:LightGrey; color:black"|Parameter 2
|style="background:LightGrey; color:black"|Process pressure
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Range
* Below 1*10<sup>-6</sup> mbar before deposition starts
|style="background:WhiteSmoke; color:black"|
* Below 5*10<sup>-6</sup> mbar during deposition
*Range
|-
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates
!style="background:silver; color:black" align="left" valign="top" rowspan="3"|Substrates
|style="background:LightGrey; color:black"|Batch size
|style="background:LightGrey; color:black"|Batch size
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*<nowiki>#</nowiki> small samples
*Up to four 6" wafers per standard run
*<nowiki>#</nowiki> 50 mm wafers
*Or up to three 8" wafers
*<nowiki>#</nowiki> 100 mm wafers
*Up to one 6" wafer with tilt
*<nowiki>#</nowiki> 150 mm wafers
*Deposition on one side of the substrate
|style="background:WhiteSmoke; color:black"|
*<nowiki>#</nowiki> small samples
*<nowiki>#</nowiki> 50 mm wafers
*<nowiki>#</nowiki> 100 mm wafers
*<nowiki>#</nowiki> 150 mm wafers
|-
|-
| style="background:LightGrey; color:black"|Allowed materials
| style="background:LightGrey; color:black"|Substrate material allowed
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Allowed material 1
*Silicon wafers
*Allowed material 2
*Quartz wafers
*Pyrex wafers
|-
| style="background:LightGrey; color:black"|Material allowed on the substrate
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Allowed material 1
*Silicon oxide
*Allowed material 2
*Silicon (oxy)nitride
*Allowed material 3
*Photoresist
*PMMA
*Mylar
*Metals
|-  
|-  
|}
|}


<br clear="all" />
'''*''' ''For thicknesses above 600 nm please request permission so we can ensure that enough material will be present.''

Revision as of 15:56, 5 July 2018

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E Beam Evaporator (Temescal)

The Temescal is a system for depositing metals by electron-beam evaporation. It also has an ion source for in-situ Argon sputtering that can be used either for cleaning samples prior to deposition or to modify the film during deposition. Wafers are loaded into the top of the chamber, which acts as a loadlock as it can be separated from the rest of the chamber by a large gate valve. Deposition will happen on all samples that are loaded together. You can load up to four 6" wafers or three 8" wafers for line-of sight deposition, or up to one 6" wafer for tilted deposition (smaller samples may be tilted more). By using different sample holder inserts, you can deposit metals on samples of different sizes and shapes. The system contains 6 metals at a time and the metals are exchanged based on user requests, so please request the metals you wish well in advance.

The Temescal E-beam evaporator in cleanroom A-5


The user manual, user APV, and contact information can be found in LabManager:

E Beam Evaporator (Temescal) in LabManager

Process information

Materials for e-beam evaporation

Note that to date (July 2018) we have processes available for deposition of Al, Cr, Au, Ni, Pd, Ag, Ti, and W as well as Ru. More will be available as they are requested, e.g., Nb is expected in the early fall of 2018.

Equipment performance and process related parameters for the Temescal E-beam evaporator

Purpose Deposition of metals
  • E-beam evaporation of metals
  • Line-of-sight deposition
  • Possible to tilt sample
  • Possible to ion clean samples
  • Possible to modify deposition by Ar ion bombardment
Performance Film thickness
  • 10Å - 1µm* (for some materials)
Deposition rate
  • 0.5Å/s - 10Å/s
Process parameter range Process Temperature
  • Approximately room temperature
Process pressure
  • Below 1*10-6 mbar before deposition starts
  • Below 5*10-6 mbar during deposition
Substrates Batch size
  • Up to four 6" wafers per standard run
  • Or up to three 8" wafers
  • Up to one 6" wafer with tilt
  • Deposition on one side of the substrate
Substrate material allowed
  • Silicon wafers
  • Quartz wafers
  • Pyrex wafers
Material allowed on the substrate
  • Silicon oxide
  • Silicon (oxy)nitride
  • Photoresist
  • PMMA
  • Mylar
  • Metals

* For thicknesses above 600 nm please request permission so we can ensure that enough material will be present.