Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/KPFM: Difference between revisions
No edit summary |
|||
| Line 8: | Line 8: | ||
Here I shortly explain how to calibrate to get work function values: | Here I shortly explain how to calibrate to get work function values: | ||
To get a quantitative value for the work function of a sample material you need to calibrate the AFM tip you are using. This is done by measuring a material with a known work function. We do not have a certified sample for this but we are using a sample that came with the system. it has some lines of Au-Si-Al right next to each other. | To get a quantitative value for the work function of a sample material you need to calibrate the AFM tip you are using. This is done by measuring a material with a known work function. We do not have a certified sample for this but we are using a sample that came with the system. it has some lines of Au-Si-Al right next to each other. The below image is from the Bruker application note: AN10-RevA1-PeakForce_KPFM-appNote.pdf | ||
[[File:KPFM workfunction Au Si Al.jpg|400px]] | |||
Revision as of 09:16, 9 January 2018
Feedback to this page: click here
THIS PAGE IS UNDER CONSTRUCTION
KPFM (Kelvin Probe Force Microscopy) measurements can be done with this AFM Icon. It is best for mapping the surface potential on a sample with nanometer resolution but it can also be calibrated to give quantitative values.
Here I shortly explain how to calibrate to get work function values:
To get a quantitative value for the work function of a sample material you need to calibrate the AFM tip you are using. This is done by measuring a material with a known work function. We do not have a certified sample for this but we are using a sample that came with the system. it has some lines of Au-Si-Al right next to each other. The below image is from the Bruker application note: AN10-RevA1-PeakForce_KPFM-appNote.pdf
