LabAdviser/CEN: Difference between revisions
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*[[Specific Process Knowledge/Characterization/Tecnai TEM |Tecnai TEM]] | *[[Specific Process Knowledge/Characterization/Tecnai TEM |Tecnai TEM]] | ||
*[[Specific Process Knowledge/Characterization/TEM/Sample Holders|TEM sample holders - under construction]] | *[[Specific Process Knowledge/Characterization/TEM/Sample Holders|TEM sample holders - under construction]] | ||
*[[Specific Process Knowledge/CEN/Sample Holders|TEM sample holders - under construction]] | |||
==Ancillary Equipment== | ==Ancillary Equipment== |
Revision as of 08:16, 22 June 2016
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SEM's
- SEM Comparison page - both Danchip and CEN SEM's
- SEM FEI Nova 600 NanoSEM
- SEM FEI Quanta 200 ESEM FEG
- SEM Inspect S
Dual Beam's
TEM's
- TEM comparison page
- Titan ATEM
- Titan ETEM
- Tecnai TEM
- TEM sample holders - under construction
- TEM sample holders - under construction