LabAdviser/CEN: Difference between revisions
Line 22: | Line 22: | ||
*[[/Sample Preparation|Sample Preparation Overview]] | *[[/Sample Preparation|Sample Preparation Overview]] | ||
*Optical microscopes | *[[/Ancillary Equipment|Optical microscopes]] | ||
*Ion milling | *Ion milling |
Revision as of 10:53, 8 December 2015
THIS PAGE IS UNDER CONSTRUCTION
Feedback to this page: click here
SEM's
Dual Beam's
TEM's
Ancillary Equipment
- Ion milling
- Pumping stations
- Polishing
- Saws
- Plasma cleaner
- Coaters
- Sonicators
- Hot plates
- Plunger
- Microtomes
- Critical point dryer
- Centrifuge
- pH meter