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| </gallery> | | </gallery> |
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| == Automatic peak identification of survey spectra == | | == Automatic peak identification of survey spectra == |
| <span style="font-size: 90%; text-align: right;">[[Specific_Process_Knowledge/Characterization/XPS/Processing/Basics#top|Go to top of this page]]</span>
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| Maximize the view of the survey spectrum:
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| [[File:XPS-basics04.jpg|700px]]
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| As shown in the bottom of the image above, this experiment holds several levels - the reason is that the exeriment is a depth profile in which a repeated set of spectra of a sample are recorded as the surface is gradually removed by an ion bombardment. Scroll through the individual levels, either by using the 'Etch time' or 'Etch Level' scroll buttons and see how the spectra change. Level 0 is the first spectrum.
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| If more levels (such as in a depth profile) are available, one can change the display mode:
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| <gallery caption="Different views of spectra in experiments with several levels" widths="350" perrow="2">
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| Image:XPS-basics03display3.jpg | 2D Chart view
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| Image:XPS-basics03display4.jpg | Stacked Chart view
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| Image:XPS-basics03display1.jpg | 3D Chart view
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| Image:XPS-basics03display2.jpg | Image view
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| </gallery>
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| == Survey spectrum peak identification == | | == Survey spectrum peak identification == |
