Specific Process Knowledge/Thin film deposition/Deposition of Titanium Oxide: Difference between revisions
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![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter System Lesker]] | ![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter System Lesker]] | ||
![[Specific Process Knowledge/Thin film deposition/III-V Dielectric evaporator|III-V Dielectric evaporator]] | ![[Specific Process Knowledge/Thin film deposition/III-V Dielectric evaporator|III-V Dielectric evaporator]] | ||
![[Specific Process Knowledge/Thin film deposition/ALD Picosun R200|ALD Picosun 200]] | |||
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* E-beam evaporation of TiO2 | * E-beam evaporation of TiO2 | ||
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*ALD (atomic layer deposition of TiO<sub>2</sub> | |||
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*unknown | *unknown | ||
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* unknown | *unknown | ||
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*Covers sample everywhere (but long purge time needed very very high aspect ratio structures) | |||
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*~10nm - ~200 nm | *~10nm - ~200 nm | ||
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* 0nm - 100nm | |||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
!Deposition rate | !Deposition rate | ||
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* 1 - 2 Å/s | * 1 - 2 Å/s | ||
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* Not measured | |||
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*Done at RT. There is a possibility to run at higher temperatures | *Done at RT. There is a possibility to run at higher temperatures | ||
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* Sample temperature can be set to 20-250 <sup>o</sup>C | *Sample temperature can be set to 20-250 <sup>o</sup>C | ||
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*120<sup>o</sup>C - 150<sup>o</sup>C: Amorphous TiO<sub>2</sub> | |||
*300<sup>o</sup>C - 3450<sup>o</sup>C: Anatase TiO<sub>2</sub> | |||
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*[[/IBSD of TiO2|TiO2 made on IBE/IBSD Ionfab300]] | *[[/IBSD of TiO2|TiO2 made on IBE/IBSD Ionfab300]] | ||
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*1x 2" wafer or | *1x 2" wafer or | ||
*several smaller samples | *several smaller samples | ||
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*1-5 100 mm wafers | |||
*1-5 150 mm wafers | |||
*Several smaller samples | |||
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*Pb and poisonous materials only after special agreement | *Pb and poisonous materials only after special agreement | ||
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*Silicon | |||
*Silicon oxide, silicon nitride | |||
*Quartz/fused silica | |||
*Al, Al<sub>2</sub>O<sub>3</sub> | |||
*Ti, TiO<sub>2</sub> | |||
*Other metals (use dedicated carrier wafer) | |||
*III-V materials (use dedicated carrier wafer) | |||
*Polymers (depending on the melting point/deposition temperature, use carrier wafer) | |||
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Revision as of 14:08, 31 August 2015
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Deposition of Titanium Oxide
Titanium oxide can be deposited only by sputter technique. At the moment the only system where we have a target for Titanium oxide is IBE/IBSD Ionfab300. The target is Ti. During the sputter deposition oxygen is added to the chamber resulting in Titanium oxide on the sample.
Comparison of the methods for deposition of Titanium Oxide
Sputter technique using IBE/IBSD Ionfab300 | Sputter System Lesker | III-V Dielectric evaporator | ALD Picosun 200 | |
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Generel description |
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Stoichiometry |
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Film Thickness |
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Deposition rate |
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Step coverage |
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Process Temperature |
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More info on TiO2 |
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Substrate size |
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Allowed materials |
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