Specific Process Knowledge/Thermal Process/Furnace: Multipurpose annealing/Acceptance test: Difference between revisions

From LabAdviser
Pevo (talk | contribs)
No edit summary
Pevo (talk | contribs)
Line 106: Line 106:
| 1.4
| 1.4
| 1.3
| 1.3
|}
{| border="2" cellpadding="2" cellspacing="1" style="text-align:center;"
|-
|-
! Common
! colspan="3" | Run-to-run
| colspan="23" | Temperature 20 degs, HBC 10 torr, Short funnel, with baffle & 5mm spacers
|-
! width="90" | Average oxide thickness [nm]
! width="90" | St. deviation
! width="90" | Non-uniformity [%]
|-
| 105.2
| 2.1
| 2.0
|}
|}

Revision as of 09:20, 12 August 2015

THIS PAGE IS UNDER CONSTRUCTION

The acceptance for the Multipurpose Anneal furnace was performed in November 2014 by ATV Technologie.



Recipe: "vr_dryOx_1000C_120min_150_5Wafer_D1_mit_Inliner_oPurgering.ATV"

Oxidation time: 80 min

Oxidation temperature: 1050 oC (all temoperature zones)

O2 flow: 1 slm

The oxidation has been done with 150 mm wafer, and with 30 wafers in the furnace.

Wafer 4 (towards the door), wafer 16 and wafer 28 (towards the service area) were measured.

Results

The oxide thickness has been measured in 13 points on each wafer using the M-2000V ellipsometer.

Date Wafer 4 Wafer 16 Wafer 28 Center point only
Average oxide thickness [nm] St. deviation Non-uniformity [%] Average oxide thickness [nm] St. deviation Non-uniformity [%] Average oxide thickness [nm] St. deviation Non-uniformity [%] Average oxide thickness [nm] St. deviation Non-uniformity [%]
Run 1 28-01-2015 109.7 1.0 1.7 107.7 0.9 1.1 106.5 0.8 1.2 107.0 2.1 1.9
Run 2 28-01-2015 107.3 1.7 2.4 105.0 1.4 1.7 107.3 0.7 0.9 105.7 1.0 0.9
Run 3 30-01-2015 103.6 0.8 1.1 102.6 0.6 1.2 102.2 0.6 1.1 102.9 1.0 1.0
Average 106.9 1.2 1.7 105.1 1.0 1.3 105.3 0.7 1.1 105.2 1.4 1.3


Run-to-run
Average oxide thickness [nm] St. deviation Non-uniformity [%]
105.2 2.1 2.0