Specific Process Knowledge/Thin film deposition/Deposition of Silicon: Difference between revisions
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|-style="background:silver; color:black" | |-style="background:silver; color:black" | ||
! | ! | ||
! Sputter([[Specific Process Knowledge/Thin film deposition/Multisource PVD|PVD co-sputter/evaporation]]) | ! Sputter([[Specific Process Knowledge/Thin film deposition/Multisource PVD|PVD co-sputter/evaporation]]) | ||
! Furnace PolySi ([[Specific Process Knowledge/Thin film deposition/Furnace LPCVD PolySilicon|Furnace LPCVD pSi]]) | ! Furnace PolySi ([[Specific Process Knowledge/Thin film deposition/Furnace LPCVD PolySilicon|Furnace LPCVD pSi]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ||
! Sputter ([[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]]) | ! Sputter ([[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Alcatel|Alcatel]]) | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Batch size | ! Batch size | ||
| | | | ||
* | * 4x 6" wafers or | ||
* | * 4x 4" wafers or | ||
* 4x 2" wafers | |||
| | | | ||
*1-25 wafers of 4" | *1-25 wafers of 4" | ||
*For other sizes ask the ThinFilm group | *For other sizes ask the ThinFilm group | ||
| | | | ||
* | *24x 2" wafers or | ||
* | *6x 4" wafers or | ||
* | *6x 6" wafers | ||
| | | | ||
* Several small samples mounted with capton tape | * Several small samples mounted with capton tape | ||
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* 1x 150 mm wafer | * 1x 150 mm wafer | ||
* 1x 200 mm wafer | * 1x 200 mm wafer | ||
| | |||
*Up to 1x4" wafers | |||
*smaller pieces | |||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Pre-clean | ! Pre-clean | ||
|RF Ar clean | |RF Ar clean | ||
|RCA clean for wafers that are not fresh form the box. | |RCA clean for wafers that are not fresh form the box. | ||
|RF Ar clean | |RF Ar clean | ||
|. | |. | ||
|RF Ar clean | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Layer thickness | ! Layer thickness | ||
|10Å to about 3000Å | |10Å to about 3000Å | ||
|~50Å to 2µm, if thicker layers are needed please ask the furnace team. | |~50Å to 2µm, if thicker layers are needed please ask the furnace team. | ||
|10Å to about 3000Å | |10Å to about 3000Å | ||
|. | |. | ||
|10Å to 2000Å | |||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Deposition rate | ! Deposition rate | ||
|Dependent on process parameters, but in the order of 1 Å/s. See more [[Specific Process Knowledge/Thin film deposition/Si sputter in PVD co-sputter/evaporation|here]] | |Dependent on process parameters, but in the order of 1 Å/s. See more [[Specific Process Knowledge/Thin film deposition/Si sputter in PVD co-sputter/evaporation|here]] | ||
| | | | ||
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|. | |. | ||
Dependent on process parameters, but in the order of 1 Å/s. See more [[Specific Process Knowledge/Thin film deposition/Si sputter in Wordentec|here.]] | Dependent on process parameters, but in the order of 1 Å/s. See more [[Specific Process Knowledge/Thin film deposition/Si sputter in Wordentec|here.]] | ||
|. | | About 6-8 nm/min. See more [[Specific_Process_Knowledge/Etch/IBE⁄IBSD_Ionfab_300/IBSD_of_Si|here.]] | ||
|2Å/s to 15Å/s | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Process temperature | ! Process temperature | ||
| Option: heating wafer up to 400 deg C | | Option: heating wafer up to 400 deg C | ||
|560 <sup>o</sup>C (amorph) and 620 <sup>o</sup>C (poly) | |560 <sup>o</sup>C (amorph) and 620 <sup>o</sup>C (poly) | ||
|? | |? | ||
|. | |. | ||
|? | |||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Step coverage | ! Step coverage | ||
|. | |. | ||
|Good | |Good | ||
|. | |. | ||
|. | |. | ||
|Poor | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Adhesion | ! Adhesion | ||
|. | |. | ||
|Good for fused silica, silicon oxide, silicon nitride, silicon | |Good for fused silica, silicon oxide, silicon nitride, silicon | ||
|. | |. | ||
|. | |. | ||
|Bad for pyrex, for other materials we do not know | |||
|- | |||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Allowed substrates | ! Allowed substrates | ||
|Pyrex, fused silica, silicon, metals, oxide, nitride | |Pyrex, fused silica, silicon, metals, oxide, nitride | ||
|Fused silica, Silicon, oxide, nitride | |Fused silica, Silicon, oxide, nitride | ||
|Pyrex, fused silica, silicon, metals, oxide, nitride | |Pyrex, fused silica, silicon, metals, oxide, nitride | ||
|. | |. | ||
| | |||
* Silicon wafers | |||
* Quartz wafers | |||
* Pyrex wafers | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Allowed material | ! Allowed material | ||
| | |||
| | |||
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| | | | ||
* Silicon oxide | * Silicon oxide | ||
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* SU-8 | * SU-8 | ||
* Metals | * Metals | ||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Doping facility | ! Doping facility | ||
|None | |None | ||
|Can be doped during deposition with Boron and/or Phosphorous | |Can be doped during deposition with Boron and/or Phosphorous | ||
| None | | None | ||
|. | |. | ||
|None | |||
|-style="background:WhiteSmoke; color:black" | |||
! Comment | |||
| | |||
| | |||
| | |||
| | |||
| This process is not running really stable nowadays. | |||
|} | |} | ||
Revision as of 12:56, 17 March 2014
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PolySilicon can be sputtered in Alcatel and be deposited in the PolySilicon furnace. In the chart below you can compare the two different deposition methodes:
Sputter(PVD co-sputter/evaporation) | Furnace PolySi (Furnace LPCVD pSi) | Sputter (Wordentec) | Sputter (IBE/IBSD Ionfab 300) | Sputter (Alcatel) | |
---|---|---|---|---|---|
Batch size |
|
|
|
|
|
Pre-clean | RF Ar clean | RCA clean for wafers that are not fresh form the box. | RF Ar clean | . | RF Ar clean |
Layer thickness | 10Å to about 3000Å | ~50Å to 2µm, if thicker layers are needed please ask the furnace team. | 10Å to about 3000Å | . | 10Å to 2000Å |
Deposition rate | Dependent on process parameters, but in the order of 1 Å/s. See more here |
|
.
Dependent on process parameters, but in the order of 1 Å/s. See more here. |
About 6-8 nm/min. See more here. | 2Å/s to 15Å/s |
Process temperature | Option: heating wafer up to 400 deg C | 560 oC (amorph) and 620 oC (poly) | ? | . | ? |
Step coverage | . | Good | . | . | Poor |
Adhesion | . | Good for fused silica, silicon oxide, silicon nitride, silicon | . | . | Bad for pyrex, for other materials we do not know |
Allowed substrates | Pyrex, fused silica, silicon, metals, oxide, nitride | Fused silica, Silicon, oxide, nitride | Pyrex, fused silica, silicon, metals, oxide, nitride | . |
|
Allowed material |
| ||||
Doping facility | None | Can be doped during deposition with Boron and/or Phosphorous | None | . | None |
Comment | This process is not running really stable nowadays. |
Sputtered Silicon in the Alcatel
The parameter(s) changed | New value(s) | Deposition rate |
---|---|---|
Standard parameters | None | |
Power | 400W | 3.8 Å/s |
Sputtered Silicon in the PVD co-sputter/evaporation
See this page: Si sputter in PVD co-sputter/evaporation
Sputtered Silicon in Wordentec
See this page: Si sputter in Wordentec