Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, an AFM and three SEM's. | |||
In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced [[Specific Process Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/FEI|FEI SEM]] that is capable of taking high magnification images of any sample or wafer. | |||
Revision as of 08:54, 11 January 2008
The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, an AFM and three SEM's.
In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced FEI SEM that is capable of taking high magnification images of any sample or wafer.
| Optical microscopes | SEM | AFM | Profiler | |
|---|---|---|---|---|
| Magnification | ||||
| Depth of focus |