Specific Process Knowledge/Etch/Etching of Silicon Oxide/SiO2 etch using AOE: Difference between revisions
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Etching of Silicon Oxide | ==Etching of micro structures in Silicon Oxide with photoresist or (poly)silicon as masking material== | ||
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==Etching of micro structures in Silicon Oxide with Aluminium as masking material== | |||
{| border="2" cellspacing="2" cellpadding="3" | |||
!Parameter | |||
!Al mask | |||
|- | |||
|Coil Power [W] | |||
|1800 | |||
|- | |||
|Platen Power [W] | |||
|180 | |||
|- | |||
|Platen temperature [<sup>o</sup>C] | |||
|35 | |||
|- | |||
|C<math>_4</math>F<math>_8</math> flow [sccm] | |||
|80 | |||
|- | |||
|O<math>_2</math> flow [sccm] | |||
|10 | |||
|- | |||
|Pressure [mTorr] | |||
|6 | |||
|- | |- | ||
|} | |} |
Revision as of 12:39, 6 December 2007
Etching of micro structures in Silicon Oxide with photoresist or (poly)silicon as masking material
Parameter | Si mask | Resist mask |
---|---|---|
Coil Power [W] | 1300 | 1000 |
Platen Power [W] | 500 | 300 |
Platen temperature [oC] | 35 | 0 |
He flow [sccm] | 300 | 174 |
CF flow [sccm] | 18 | 10 |
H2 flow [sccm] | 0 | 8 |
Pressure [mTorr] | 4 | 4 |
Typical results | Si mask STS result | Si mask DANCHIP result | Resist mask STS result | Resist mask DANCHIP result |
---|---|---|---|---|
Etch rate [nm/min] | 500 | 300 | 280 | |
Selectivity [:1] | 20 | 4 | 3.2 | |
Profile [o] | >88 | >88 |
Etching of micro structures in Silicon Oxide with Aluminium as masking material
Parameter | Al mask |
---|---|
Coil Power [W] | 1800 |
Platen Power [W] | 180 |
Platen temperature [oC] | 35 |
CF flow [sccm] | 80 |
O flow [sccm] | 10 |
Pressure [mTorr] | 6 |