Specific Process Knowledge/Thin film deposition/Deposition of Nickel: Difference between revisions
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== Nickel deposition == | == Nickel deposition == | ||
Nickel can be deposited by e-beam evaporation | Nickel can be deposited by e-beam evaporation or sputtering at DTU Nanolab. For electroplating you will have to contact other institutes at DTU, e.g., DTU Mechanical Engineering. | ||
*[[/Electroplating of nickel|Electroplating of nickel]] | Some process information is available here for e-beam evaporated films: | ||
<!--*[[/Electroplating of nickel|Electroplating of nickel]]--> | |||
*[[/Stress Wordentec Ni films|Stress in Wordentec Ni films: study here]]. | *[[/Stress Wordentec Ni films|Stress in Wordentec Ni films: study here]]. | ||
In the chart below you can compare the different deposition equipment: | |||
{| border="1" cellspacing="0" cellpadding="3" | {| border="1" cellspacing="0" cellpadding="3" | ||
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! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Lesker|Lesker]]) | ! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Lesker|Lesker]]) | ||
! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Cluster-based multi-chamber high vacuum sputtering deposition system|Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)]]) | ! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Cluster-based multi-chamber high vacuum sputtering deposition system|Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)]]) | ||
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|Sputter deposition of Nickel | |Sputter deposition of Nickel | ||
|Sputter deposition of Nickel | |Sputter deposition of Nickel | ||
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|RF Ar clean | |RF Ar clean | ||
|RF Ar clean | |RF Ar clean | ||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
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|10 Å to 5000 Å ** | |10 Å to 5000 Å ** | ||
|10 Å to 5000 Å ** | |10 Å to 5000 Å ** | ||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
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|Depends on process parameters, about 1 Å/s | |Depends on process parameters, about 1 Å/s | ||
|Depends on process parameters, at least ~ 4 Å/s, see conditions [[Specific_Process_Knowledge/Thin_film_deposition/Cluster-based_multi-chamber_high_vacuum_sputtering_deposition_system#Standard_recipe_performance|here]] | |Depends on process parameters, at least ~ 4 Å/s, see conditions [[Specific_Process_Knowledge/Thin_film_deposition/Cluster-based_multi-chamber_high_vacuum_sputtering_deposition_system#Standard_recipe_performance|here]] | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
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*Up to 10x4" or 6" wafers | *Up to 10x4" or 6" wafers | ||
*Many smaller pieces | *Many smaller pieces | ||
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*Almost any that do not outgas. Check the cross-contamination sheet in Labmanager. | *Almost any that do not outgas. Check the cross-contamination sheet in Labmanager. | ||
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*May use high-strength magnet for deposition | *May use high-strength magnet for deposition | ||
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Revision as of 09:45, 9 June 2023
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Nickel deposition
Nickel can be deposited by e-beam evaporation or sputtering at DTU Nanolab. For electroplating you will have to contact other institutes at DTU, e.g., DTU Mechanical Engineering.
Some process information is available here for e-beam evaporated films:
In the chart below you can compare the different deposition equipment:
E-beam evaporation (Temescal) | E-beam evaporation (Wordentec) | Sputter deposition (Lesker) | Sputter deposition (Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)) | |
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General description | E-beam deposition of Nickel | E-beam deposition of Nickel | Sputter deposition of Nickel | Sputter deposition of Nickel |
Pre-clean | Ar ion bombardment | RF Ar clean | RF Ar clean | |
Layer thickness | 10 Å to 1 µm * | 10 Å to 1 µm * | 10 Å to 5000 Å ** | 10 Å to 5000 Å ** |
Deposition rate | 2-10 Å/s | 10-15 Å/s | Depends on process parameters, about 1 Å/s | Depends on process parameters, at least ~ 4 Å/s, see conditions here |
Batch size |
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Allowed materials |
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Comment |
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* To deposit a cumulative thickness above 600 nm permission is required from metal@nanolab.dtu.dk to ensure enough material is present in the machine
** To deposit a cumulative thickness above 200 nm permission is required from metal@nanolab.dtu.dk to ensure enough material is present in the machine
Quality control of e-beam evaporated Ni films
Quality control (QC) for Wordentec | ||||||||||||||||
Thickness is measured in 5 points with a stylus profiler. |
Quality control (QC) for the Temescal | ||||||||||||||||||
Thickness is measured in 5 points with a stylus profiler. |