Specific Process Knowledge/Thin film deposition/Deposition of Tantalum: Difference between revisions
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Alcatel replaced by Temescal |
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! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/ | ! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/Temescal|Temescal]]) | ||
! Sputter ([[Specific_Process_Knowledge/Thin_film_deposition/Lesker|Lesker]]) | ! Sputter ([[Specific_Process_Knowledge/Thin_film_deposition/Lesker|Lesker]]) | ||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! General description | ! General description | ||
| E-beam deposition of Ta | | E-beam deposition of Ta | ||
(line-of-sight deposition) | |||
| Sputter deposition of Ta | | Sputter deposition of Ta | ||
(not line-of-sight) | |||
|- | |- | ||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Pre-clean | ! Pre-clean | ||
| | |Ar ion source | ||
|RF Ar clean | |RF Ar clean | ||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Layer thickness | ! Layer thickness | ||
|10Å to | |10Å to 0.6 µm* | ||
|10Å to | |10Å to ? | ||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Deposition rate | ! Deposition rate | ||
| | |0.5Å/s to 10Å/s | ||
|~0.3Å/s | |~0.3Å/s | ||
|- | |- | ||
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! Batch size | ! Batch size | ||
| | | | ||
*Up to | *Up to 4x6" wafers | ||
*smaller pieces | *Up to 3x8" wafers (ask for holder) | ||
*Many smaller pieces | |||
| | | | ||
*Pieces or | *Pieces or | ||
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| | | | ||
* Silicon | * Silicon | ||
* Silicon oxide | *Silicon oxide | ||
* Silicon (oxy)nitride | *Silicon (oxy)nitride | ||
* Photoresist | *Photoresist | ||
* PMMA | *PMMA | ||
* Mylar | *Mylar | ||
* | *Metals | ||
*See also the [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=429 cross-contamination sheet] | |||
| | | | ||
* Silicon | * Silicon | ||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Comment | ! Comment | ||
| | |As of August 2018, Mo has not yet been deposited in the Temescal. | ||
Please contact the Thin Film group to develop a process. | |||
| | | | ||
|} | |} | ||
'''*''' '' | |||
'''*''' ''If depositing more than 600 nm in total, write to metal@danchip.dtu.dk well in advance to ensure enough material is present.'' |
Revision as of 13:00, 29 August 2018
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Tantalum can be deposited by e-beam evaporation. In the chart below you can compare the different deposition equipment.
E-beam evaporation (Temescal) | Sputter (Lesker) | |
---|---|---|
General description | E-beam deposition of Ta
(line-of-sight deposition) |
Sputter deposition of Ta
(not line-of-sight) |
Pre-clean | Ar ion source | RF Ar clean |
Layer thickness | 10Å to 0.6 µm* | 10Å to ? |
Deposition rate | 0.5Å/s to 10Å/s | ~0.3Å/s |
Batch size |
|
|
Allowed materials |
|
|
Comment | As of August 2018, Mo has not yet been deposited in the Temescal.
Please contact the Thin Film group to develop a process. |
* If depositing more than 600 nm in total, write to metal@danchip.dtu.dk well in advance to ensure enough material is present.