Specific Process Knowledge/Thin film deposition/Deposition of AZO: Difference between revisions
Line 63: | Line 63: | ||
* Carbon | * Carbon | ||
| | | | ||
* Silicon | *Silicon | ||
* Silicon oxide | *Silicon oxide, silicon nitride | ||
*Quartz/fused silica | |||
* | *Al, Al<sub>2</sub>O<sub>3</sub> | ||
* | *Ti, TiO<sub>2</sub> | ||
* | *Other metals (use dedicated carrier wafer) | ||
* | *III-V materials (use dedicated carrier wafer) | ||
* | *Polymers (depending on the melting point/deposition temperature, use carrier wafer) | ||
* | |||
Revision as of 12:34, 30 January 2017
Feedback to this page: click here
THIS PAGE IS UNDER CONSTRUCTION
AZO can be deposited by Sputtering process and atomic layer deposition (ALD). In the chart below you can compare the different deposition equipment.
Sputtering deposition (Lesker) | Atomic layer deposition (ALD Picosun R200) | |
---|---|---|
General description | Sputter deposition of AZO | Atomic layer deposition of AZO |
Pre-clean | RF Ar clean | |
Layer thickness | 10Å to 5000Å* | |
Deposition rate | Depending on process parameters. | |
Batch size |
|
|
Allowed materials |
|
|
Comment |
|
* For thicknesses above 200 nm permission is required.