LabAdviser/CEN: Difference between revisions

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*[[/Sample Preparation|Sample Preparation Overview]]
*[[/Sample Preparation|Sample Preparation Overview]]


*Optical microscopes
*[[/Ancillary Equipment|Optical microscopes]]


*Ion milling
*Ion milling

Revision as of 10:53, 8 December 2015

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SEM's

Dual Beam's

TEM's

Ancillary Equipment

  • Ion milling
  • Pumping stations
  • Polishing
  • Saws
  • Plasma cleaner
  • Coaters
  • Sonicators
  • Hot plates
  • Plunger
  • Microtomes
  • Critical point dryer
  • Centrifuge
  • pH meter

Post Processing