Specific Process Knowledge/Thin film deposition/Deposition of Gold: Difference between revisions
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!Allowed materials | |||
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* Silicon oxide | |||
* Silicon (oxy)nitride | |||
* Photoresist | |||
* PMMA | |||
* Mylar | |||
* SU-8 | |||
* Metals | |||
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* Silicon oxide | |||
* Silicon (oxy)nitride | |||
* Photoresist | |||
* PMMA | |||
* Mylar | |||
* SU-8 | |||
* Metals | |||
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* Silicon | |||
* Silicon oxide | |||
* Silicon nitride | |||
* Silicon (oxy)nitride | |||
* Photoresist | |||
* PMMA | |||
* Mylar | |||
* SU-8 | |||
* Metals | |||
* Carbon | |||
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! Comment | ! Comment | ||
|For thicknesses above 200 nm | |For thicknesses above 200 nm |
Revision as of 16:04, 6 March 2014
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Gold can be deposited by e-beam evaporation. In the chart below you can compare the different deposition equipment.
E-beam evaporation (Alcatel) | E-beam evaporation (Wordentec) | Sputter (Lesker) | Sputter coater Hummer | Sputter coater Balzer | |
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Batch size |
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Pre-clean | RF Ar clean | RF Ar clean | RF Ar clean | ||
Layer thickness | 10 Å to 5000Å* | 10 Å to 5000Å* | 10 Å to | ||
Deposition rate | 2 Å/s to 10 Å/s | 1 Å/s to 10 Å/s | Not measured | Not measured | |
Allowed materials |
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. | . |
Comment | For thicknesses above 200 nm
permission is required |
For thicknesses above 200 nm
permission is required |
Used to gold sputter coating of
samples mainly before SEM characterization |
Used to gold sputter coating of
samples mainly before SEM characterization |
* For thicknesses above 200 nm permission from ThinFilm group (thinfilm@danchip.dtu.dk) is required.
Adhesion of Au on Si
Studies of Au deposition processes
Roughness of Au layers - Roughness of Au layers deposited with different equipment and settings