Specific Process Knowledge/Characterization/XPS: Difference between revisions
No edit summary |
|||
| Line 18: | Line 18: | ||
<!-- give the link to the equipment info page in LabManager: --> | <!-- give the link to the equipment info page in LabManager: --> | ||
[http://http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=276 XPS-ThermoScientific in LabManager] | [http://http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=276 XPS-ThermoScientific in LabManager] | ||
The XPS technique can be used to do elemental analysis. | |||
*[[Specific Process Knowledge/Characterization/XPS/XPS technique|XPS technique]] | |||
*[[Specific Process Knowledge/Characterization/XPS/XPS elemental composition|Elemental composition analysis]] | |||
*[[Specific Process Knowledge/Characterization/XPS/XPS Chemical states |Chemical state analysis]] | |||
*[[Specific Process Knowledge/Characterization/XPS/XPS Depth profiling|Depth profiling]] | |||
==Elemental analysis== | ==Elemental analysis== | ||