Specific Process Knowledge/Thin film deposition/Deposition of Silver: Difference between revisions
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== Deposition of | == Deposition of silver == | ||
Silver can be deposited by e-beam evaporation, by sputtering and by thermal evaporation. In the chart below you can compare the different methods on the different deposition equipment. | Silver can be deposited by e-beam evaporation, by sputtering and by thermal evaporation. In the chart below you can compare the different methods on the different deposition equipment. | ||
== Sputter deposition of silver == | |||
* [[Specific Process Knowledge/Thin film deposition/Lesker |Sputter deposition of Silver in Lesker]]. | |||
== Thermal deposition of silver == | |||
* [[/Deposition of Silver in Thermal Evaporator|Thermal deposition of Silver in the Thermal Evaporator]] | |||
<br> | |||
<br> | |||
==Comparison of Deposition Equipment for Silver== | |||
{| border="1" cellspacing="0" cellpadding="4" | {| border="1" cellspacing="0" cellpadding="4" | ||
|-style="background:silver; color:black" | |-style="background:silver; color:black" | ||
! | ! | ||
! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/ | ! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/Temescal|E-beam evaporator (Temescal)]] and [[Specific Process Knowledge/Thin film deposition/10-pocket e-beam evaporator|E-beam evaporator (10-pockets)]]) | ||
! Thermal evaporation ([[Specific Process Knowledge/Thin film deposition/thermalevaporator|Thermal Evaporator]]) | |||
! | ! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Lesker|Lesker]]) | ||
! Sputter | ! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Cluster-based multi-chamber high vacuum sputtering deposition system|Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)]]) | ||
! Sputter | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! | ! General description | ||
| | | E-beam deposition of Ag (line-of-sight, very good thickness uniformity) | ||
| Thermal deposition of Ag (line-of-sight) | |||
| Sputter deposition of Ag (some step coverage) | |||
| | | Sputter deposition of Ag including pulsed DC and HiPIMS | ||
| | |||
| | |||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Pre-clean | ! Pre-clean | ||
| | | Ar ion etch (only in E-beam evaporator Temescal) | ||
| | | none | ||
|RF Ar clean | | RF Ar clean | ||
|RF Ar clean | | RF Ar clean | ||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Layer thickness | ! Layer thickness | ||
|10Å to 1µm | |10Å to 1µm* | ||
|10Å to 0.5µm | |10Å to 0.5µm ** | ||
|10Å to about 2000Å | |||
|10Å to about | |10Å to ? | ||
|10Å to | |||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Deposition rate | ! Deposition rate | ||
| | |1 to 10Å/s | ||
| | |5Å/s | ||
| | |Dependent on process parameters. | ||
|Dependent on [[/ | |Dependent on process parameters. | ||
| | |- | ||
|-style="background:WhiteSmoke; color:black" | |||
! Batch size | |||
| | |||
*Up to 4x6" wafers or | |||
*Up to 3x8" wafers | |||
or | |||
*smaller pieces | |||
| | |||
*Up to 1x8" wafer or 1x6" wafer | |||
*Up to 3x4" wafers | |||
*smaller pieces | |||
| | |||
*1x6" wafers or | |||
*1x4" wafers or | |||
*smaller pieces | |||
| | |||
*up to 10x6" wafers or | |||
*up to 10x4" wafers or | |||
*many smaller pieces | |||
|-style="background:Lightgrey; color:black" | |||
!Allowed materials | |||
| | |||
*Almost any as long as it does not outgas if you plan to use substrate heating. See cross-contamination sheets in Labmanager. | |||
| | |||
*Almost any as long as it does not outgas. See cross-contamination sheet in Labmanager. | |||
| | |||
* Almost any that do not degas. See also the [https://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=244 cross-contamination sheet] | |||
| | |||
*Almost any that does not degas at your intended substrate temperature. See cross contamination sheets for [https://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=441 PC1] and [https://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=442 PC3] | |||
|-style="background:whitesmoke; color:black" | |||
! Comment | |||
| Pumpdown approx 20 min. Possible to tilt the wafer to achieve tunable step coverage. | |||
| Pumpdown approx 15 min. | |||
|Load and transfer < 10 minutes | |||
|Load and transfer approx. 12 minutes | |||
|- | |- | ||
|} | |} | ||
'''*''' ''For thicknesses above 600 nm please get permission from ThinFilm group by writing to metal@nanolab.dtu.dk'' | |||
'''**''' ''For thicknesses above 200 nm please get permission from ThinFilm group by writing to metal@nanolab.dtu.dk'' | |||