Specific Process Knowledge/Thin film deposition/Deposition of Titanium Nitride: Difference between revisions

From LabAdviser
Eves (talk | contribs)
Reet (talk | contribs)
No edit summary
 
(17 intermediate revisions by 3 users not shown)
Line 1: Line 1:
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_Titanium_Nitride click here]'''
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_Titanium_Nitride click here]'''
<!-- Replace "http://labadviser.danchip.dtu.dk/..." wih the link to the Labadviser page-->


''All text by Nanolab staff''
<br clear="all" />
<br clear="all" />


== Deposition of Titanium nitride ==
== Deposition of Titanium Nitride ==
Thin films of titanium nitride can only be deposited in the [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD2]] at the moment. More information about the process can be found [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)/TiN deposition using ALD2|here]].


==Comparison between sputtering and ALD methods for deposition of Titanium nitride.==
Thin films of Titanium Nitride (TiN) can be deposited by either [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD]] or reactive sputtering. If sputtering is used, the target is Ti and nitrogen (N<sub>2</sub>) is added as reactive gas to the chamber resulting the formation of Titanium Nitride on the sample. The process information is available below:
 
*[[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)/TiN deposition using ALD2|TiN deposition using ALD]].
 
*[[Specific Process Knowledge/Thin film deposition/Deposition of Titanium Nitride/Deposition of Titanium Nitride using Lesker sputter tool|TiN deposition with reactive sputtering using Lesker sputter tool]].
 
*[[Specific Process Knowledge/Thin film deposition/Deposition of Titanium Nitride/Deposition of Titanium Nitride using Sputter-System Metal-Oxide (PC1)|TiN deposition with reactive sputtering using Sputter-System Metal-Oxide (PC1)]].
 
==Comparison between sputtering and ALD methods for deposition of Titanium Nitride.==


{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;"  
{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;"  
Line 17: Line 24:


![[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD2]]
![[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD2]]
![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter System Lesker]]
![[Specific_Process_Knowledge/Thin_film_deposition/Cluster-based_multi-chamber_high_vacuum_sputtering_deposition_system|Sputter-System Metal-Oxide (PC1)/Sputter-System Metal-Nitride (PC3)]]
![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter-System(Lesker)]]
|-
|-


Line 26: Line 34:
*Atomic Layer Deposition
*Atomic Layer Deposition
|
|
*Sputtering
*Reactive sputtering
*Pulsed DC reactive sputtering
*Reactive HIPIMS (high-power impulse magnetron sputtering)
|
*Reactive sputtering
|-
|-


Line 34: Line 46:
|
|
*TiN
*TiN
|
*TiN (can be tuned)
|
|
*TiN (can be tuned)
*TiN (can be tuned)
Line 42: Line 56:
!Film Thickness
!Film Thickness
|
|
* 0nm - 50nm
* 0 nm - 50 nm
|
* few nm - ? (hundreds of nm)
|
|
* 0nm - 200nm
* few nm - 200 nm
|-
|-


Line 53: Line 69:
* 0.0173 nm/cycle on a flat sample
* 0.0173 nm/cycle on a flat sample
* 0.0232 nm/cycle on a high aspect ratio structures
* 0.0232 nm/cycle on a high aspect ratio structures
|
* about 0.12 nm/s, depends on sputtering parameters, check processlog in LabManager
|
|
* up to 0.0625 nm/s on a flat sample
* up to 0.0625 nm/s on a flat sample
Line 62: Line 80:
|
|
*Very good
*Very good
|
*not known yet
|
|
*Not investigated
*Not investigated
Line 70: Line 90:
!Process Temperature
!Process Temperature
|
|
* 450<sup>o</sup>C
* 450 °C
|
|
* 400<sup>o</sup>C
* Up to 600 °C
|
* Up to 400 °C
|-
|-


Line 83: Line 105:
*1-5 100 mm wafers
*1-5 100 mm wafers
*1-5 150 mm wafer
*1-5 150 mm wafer
|
*Many small samples
*Up to 10x100 mm or 150 mm wafers
|
|
*Several small samples
*Several small samples
Line 91: Line 116:


|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
!'''Allowed materials'''
!Allowed materials
|
|
*Silicon  
*Silicon  
Line 107: Line 132:
*Metals  
*Metals  
*III-V materials (use dedicated carrier wafer)
*III-V materials (use dedicated carrier wafer)
*Almost anything that is not toxic.
*Almost anything that is not toxic and does not outgas
|
*Silicon
*Silicon oxide, silicon nitride
*Quartz/fused silica
*Metals
*III-V materials (use dedicated carrier wafer)
*Almost anything that is not toxic
|-
|-
|}
|}

Latest revision as of 13:39, 2 June 2023

Feedback to this page: click here

All text by Nanolab staff

Deposition of Titanium Nitride

Thin films of Titanium Nitride (TiN) can be deposited by either ALD or reactive sputtering. If sputtering is used, the target is Ti and nitrogen (N2) is added as reactive gas to the chamber resulting the formation of Titanium Nitride on the sample. The process information is available below:

Comparison between sputtering and ALD methods for deposition of Titanium Nitride.

ALD2 Sputter-System Metal-Oxide (PC1)/Sputter-System Metal-Nitride (PC3) Sputter-System(Lesker)
Generel description
  • Atomic Layer Deposition
  • Reactive sputtering
  • Pulsed DC reactive sputtering
  • Reactive HIPIMS (high-power impulse magnetron sputtering)
  • Reactive sputtering
Stoichiometry
  • TiN
  • TiN (can be tuned)
  • TiN (can be tuned)
Film Thickness
  • 0 nm - 50 nm
  • few nm - ? (hundreds of nm)
  • few nm - 200 nm
Deposition rate
  • 0.0173 nm/cycle on a flat sample
  • 0.0232 nm/cycle on a high aspect ratio structures
  • about 0.12 nm/s, depends on sputtering parameters, check processlog in LabManager
  • up to 0.0625 nm/s on a flat sample
Step coverage
  • Very good
  • not known yet
  • Not investigated
Process Temperature
  • 450 °C
  • Up to 600 °C
  • Up to 400 °C
Substrate size
  • Several small samples
  • 1-5 50 mm wafers
  • 1-5 100 mm wafers
  • 1-5 150 mm wafer
  • Many small samples
  • Up to 10x100 mm or 150 mm wafers
  • Several small samples
  • 100 mm wafer
  • 150 mm wafer
Allowed materials
  • Silicon
  • Silicon oxide, silicon nitride
  • Quartz/fused silica
  • Al, Al2O3
  • Ti, TiO2
  • Other metals (use dedicated carrier wafer)
  • III-V materials (use dedicated carrier wafer)
  • Polymers (depending on the melting point/deposition temperature, use carrier wafer)
  • Silicon
  • Silicon oxide, silicon nitride
  • Quartz/fused silica
  • Metals
  • III-V materials (use dedicated carrier wafer)
  • Almost anything that is not toxic and does not outgas
  • Silicon
  • Silicon oxide, silicon nitride
  • Quartz/fused silica
  • Metals
  • III-V materials (use dedicated carrier wafer)
  • Almost anything that is not toxic